Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Shweta Khokale"'
Autor:
Vibhor Jain, John Pekarik, Crystal Kenney, Judson Holt, Chris Durcan, Jeffrey B. Johnson, Sudesh Saroop, Mona Nafari, Vaibhav Ruparelia, Santosh Kumar Gedela, Prateek Kumar Sharma, Viorel Ontalus, Shweta Khokale, Saloni Chaurasia, Venkata Vanukuru, Alvin Joseph
Publikováno v:
2022 International Electron Devices Meeting (IEDM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e900bacd47b5bbc82eb3954edf4ae348
https://doi.org/10.1109/iedm45625.2022.10019417
https://doi.org/10.1109/iedm45625.2022.10019417
Autor:
John Pekarik, Vibhor Jain, Crystal Kenney, Judson Holt, Shweta Khokale, Sudesh Saroop, Jeffrey B. Johnson, Kenneth Stein, Viorel Ontalus, Christopher Durcan, Mona Nafari, Tayel Nesheiwat, Sangameshwar Saudari, Elahe Yarmoghaddam, Saloni Chaurasia, Alvin Joseph
Publikováno v:
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4450292de96dca135af04c6ff49b9939
https://doi.org/10.1109/bcicts50416.2021.9682454
https://doi.org/10.1109/bcicts50416.2021.9682454
Autor:
Jack Pekarik, Vibhor Jain, Crystal Kenney, Judson Holt, Shweta Khokale, Sudesh Saroop, Jeffrey Johnson, Kenneth Stein, Viorel Ontalus, Christopher Durcan, Mona Nafari, Tayel Nesheiwat, Sangameshwar Saudari, Elahe Yarmoghaddam, Saloni Chaurasia, Alvin Joseph
Publikováno v:
ECS Meeting Abstracts. :1196-1196
D-band (110-170GHz) spectrum is gaining attention for various applications, including 6G mm-Wave, sub-THz sensing, and radar. These systems require lattice spacing for antenna elements at sub-1mm and a very low loss signal path from antenna to integr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::764a00a3300d239b378af2746dff1722
https://doi.org/10.1149/ma2022-02321196mtgabs
https://doi.org/10.1149/ma2022-02321196mtgabs
Autor:
Alexa Greer, Sonal Singh, Ankit Jain, Panneerselvam Venkatachalam, Qian Xie, Abhinav Mathur, Shweta Khokale
Publikováno v:
2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Semiconductor yield improvement and stability is becoming increasingly more difficult to achieve with decreasing technology nodes. There are many new sources, types, and mechanisms of process induced systematic defects, with a growing demand to ident
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e9ce965ee15e2e1f5ef2f3e18cb2ccf
https://doi.org/10.1109/asmc.2019.8791828
https://doi.org/10.1109/asmc.2019.8791828