Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Shuzo Masui"'
Publikováno v:
Micromachines, Vol 15, Iss 7, p 908 (2024)
Step emulsification is a key technique for achieving scalable production of monodisperse emulsion droplets owing to its resilience to flow fluctuations. However, the persistent issue of satellite droplets, an inherent byproduct of main droplets, pose
Externí odkaz:
https://doaj.org/article/6235eb97603a48d1942bab59f2e3d24d
Publikováno v:
Sensors, Vol 24, Iss 12, p 3821 (2024)
The concept of an optical profiler based on optical resonance was proposed, highlighting the initial requirements for mode number estimation. We proposed a method for estimating the longitudinal mode number of a laser propagating in an external cavit
Externí odkaz:
https://doaj.org/article/1ecb73ebe40a40c19133c0aa0d6013e5
Autor:
Yuki Torii, Satoru Takahashi, Masaki Michihata, Kiyoshi Takamasu, Yuki Matsumoto, Shuzo Masui, Kunikazu Suzuki
Publikováno v:
Nanomanufacturing and Metrology. 4:256-270
Surface microstructures impart various useful properties to objects, for example, improving optical characteristics, wettability, and sliding properties. It is well known that biomimicking relief structures are effective in making such properties ari
Publikováno v:
Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21. :101-045
Publikováno v:
CIRP Annals. 69:477-480
In order to realize dual-periodic microstructured surfaces, which are required for next-generation multi-functional surfaces for various fields, multi-exposure laser interference lithography (MELIL) is recognized as one of the potential fabrication m
Publikováno v:
Asian Society for Precision Engineering and Nanotechnology (ASPEN 2022).
Publikováno v:
Asian Society for Precision Engineering and Nanotechnology (ASPEN 2022).
Autor:
Yuki Torii, Shuzo Masui, Yuki Matsumoto, Kunikazu Suzuki, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
Publikováno v:
Nanomanufacturing and Metrology. 5:444-444
Publikováno v:
Journal of Physics: Conference Series. 2368:012014
Nowadays, the yield rate of semiconductor process is strongly affected even by nanoscale defects on bare Si wafer surfaces. Therefore, a non-destructive and high-speed method for detection of nanoparticle contamination is highly demanded. In this res
Publikováno v:
Optical Trapping and Optical Micromanipulation XVIII.
As represented by "Lab on a Tip" using microchannels, the miniaturization of manufacturing and inspection processes attracts widespread interest. Therefore, many micro-tool fabrication techniques using optical tweezers have been reported. Most report