Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Shuxian Lv"'
Autor:
Meiwen Chen, Shuxian Lv, Boping Wang, Pengfei Jiang, Yuanxiang Chen, Yaxin Ding, Yuan Wang, Yuting Chen, Yan Wang
Publikováno v:
Nanomaterials, Vol 13, Iss 10, p 1608 (2023)
In this article, the endurance characteristic of the TiN/HZO/TiN capacitor was improved by the laminated structure of a ferroelectric Hf0.5Zr0.5O2 thin film. Altering the HZO deposition ratio, the laminated-structure interlayer was formed in the midd
Externí odkaz:
https://doaj.org/article/1cc8ce8acf0944b4b78bc5e73a47ad3a
Autor:
Yuan Wang, Yang Yang, Pengfei Jiang, Shuxian Lv, Boping Wang, Yuting Chen, Yaxin Ding, Tiancheng Gong, Bing Chen, Ran Cheng, Xiao Yu, Qing Luo
Publikováno v:
IEEE Electron Device Letters. 44:943-946
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8c20af5d5ccfb50038dba48edf472c9
https://doi.org/10.1109/led.2023.3267787
https://doi.org/10.1109/led.2023.3267787
Autor:
Pengfei Jiang, Yang Yang, Wei Wei, Tiancheng Gong, Yuan Wang, Yuting Chen, Yaxin Ding, Shuxian Lv, Boping Wang, Meiwen Chen, Yan Wang, Qing Luo
Publikováno v:
IEEE Electron Device Letters. 44:602-605
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ae3cc89c3911283c63a287ba2d34964c
https://doi.org/10.1109/led.2023.3248103
https://doi.org/10.1109/led.2023.3248103
Autor:
Yaxin Ding, Peng Yuan, Jie Yu, Yuting Chen, Pengfei Jiang, Yuan Wang, Yannan Xu, Shuxian Lv, Zhiwei Dang, Boping Wang, Xiaoxin Xu, Tiancheng Gong, Qing Luo
Publikováno v:
IEEE Transactions on Electron Devices. 69:5391-5394
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a50697e378aeae010c2ca5820ae1367d
https://doi.org/10.1109/ted.2022.3191988
https://doi.org/10.1109/ted.2022.3191988
Autor:
Peng Yuan, Boping Wang, Yang Yang, Shuxian Lv, Yuan Wang, Yannan Xu, Pengfei Jiang, Yuting Chen, Zhiwei Dang, Yaxin Ding, Tiancheng Gong, Qing Luo
Publikováno v:
IEEE Electron Device Letters. 43:1045-1048
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f31a408aaecd4f8250bbbdc03796d0aa
https://doi.org/10.1109/led.2022.3178867
https://doi.org/10.1109/led.2022.3178867
Autor:
Yuting Chen, Yang Yang, Peng Yuan, Pengfei Jiang, Yannan Xu, Shuxian Lv, Yaxin Ding, Zhiwei Dang, Tiancheng Gong, Yan Wang, Qing Luo
Publikováno v:
IEEE Electron Device Letters. 43:930-933
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ae03a9deab12e7403b21ef8704299a7
https://doi.org/10.1109/led.2022.3171273
https://doi.org/10.1109/led.2022.3171273
Autor:
Zhiwei Dang, Shuxian Lv, Zhaomeng Gao, Meiwen Chen, Yannan Xu, Pengfei Jiang, Yaxin Ding, Peng Yuan, Yuan Wang, Yuting Chen, Qing Luo, Yan Wang
Publikováno v:
IEEE Electron Device Letters. 43:561-564
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1edc9721899068d842546faeffae9d78
https://doi.org/10.1109/led.2022.3153063
https://doi.org/10.1109/led.2022.3153063
Autor:
Yannan Xu, Yang Yang, Shengjie Zhao, Tiancheng Gong, Pengfei Jiang, Yuan Wang, Peng Yuan, Zhiwei Dang, Yuting Chen, Shuxian Lv, Yaxin Ding, Yan Wang, Jinshun Bi, Qing Luo
Publikováno v:
IEEE Transactions on Electron Devices. 69:2145-2150
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac3f54476c766f585bde2070dddce6ca
https://doi.org/10.1109/ted.2021.3139054
https://doi.org/10.1109/ted.2021.3139054
Autor:
Yaxin Ding, Yan Wang, Zhiwei Dang, Tiancheng Gong, Pengfei Jiang, Jinshun Bi, Yannan Xu, Haoran Yu, Yang Yang, Yuting Chen, Peng Yuan, Shuxian Lv, Shengjie Zhao, Yuan Wang, Qing Luo
Publikováno v:
IEEE Transactions on Electron Devices. 69:430-433
In this brief, we reported the improved break-down reliability and endurance in 10-nm Hf $_{0.5}$ Zr $_{0.5}$ O₂(HZO) using grain boundary interruption. By inserting an amorphous Al₂O₃ layer in the middle of polycrystalline HZO, grain boundarie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1dbd35859a0695cd93994a91119df2bc
https://doi.org/10.1109/ted.2021.3126283
https://doi.org/10.1109/ted.2021.3126283
Autor:
Pengfei Jiang, Kunran Xu, Jie Yu, Yannan Xu, Peng Yuan, Yuan Wang, Yuting Chen, Yaxin Ding, Shuxian Lv, Zhiwei Dang, Tiancheng Gong, Yang Yang, Yan Wang, Qing Luo
Publikováno v:
Science China Information Sciences. 66
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e0c6c1534654a534554104ba634d0d4
https://doi.org/10.1007/s11432-022-3508-7
https://doi.org/10.1007/s11432-022-3508-7