Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Shunta Nakanishi"'
Autor:
Takahiro Hida, Hiroyuki Uchida, Takaaki Tanaka, Tomoyuki Okuno, Hiroki Kamehama, Kouichi Hagino, Yukino Urabe, Kazuho Kayama, Keiichiro Kagawa, Ikuo Kurachi, Junko S. Hiraga, Ayaki Takeda, Sumeet Shrestha, Masayuki Yoshida, Yusuke Nishioka, Daito Yuhi, Shoji Kawahito, Keigo Yarita, Hiroshi Tsunemi, Keita Yasutomi, Kenji Oono, Hideaki Matsumura, Takayoshi Kohmura, Koji Mori, Kohsuke Negishi, Kohei Fukuda, Takeshi Go Tsuru, Shotaro Sakuma, Yasuo Arai, Masataka Yukumoto, Sodai Harada, Shunta Nakanishi, Yuki Amano, Yasuaki Kamata
We have been developing a monolithic active pixel sensor, ``XRPIX``, for the Japan led future X-ray astronomy mission ``FORCE`` observing the X-ray sky in the energy band of 1-80 keV with angular resolution of better than 15``. XRPIX is an upper part
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::691af727423cb05cf77ee0e068d70156
Autor:
Sodai Harada, Kohsuke Negishi, Shoma Yokoyama, Kohei Fukuda, Takeshi Go Tsuru, Takayoshi Kohmura, Keita Yasutomi, Keigo Yarita, Koji Mori, Hideaki Matsumura, Sumeet Shrestha, Shunta Nakanishi, Hideki Hayashi, Shoji Kawahito, Nobuaki Takebayashi, Yasuo Arai, Hiroyuki Uchida, Keiichiro Kagawa, Ikuo Kurachi, Takaaki Tanaka, Ayaki Takeda, Kenji Ohno, Yusuke Nishioka, Katsuhiro Tachibana, Hiroki Kamehama, Kouichi Hagino
We have been developing monolithic active pixel sensors, X-ray Astronomy SOI pixel sensors, XRPIXs, based on a Silicon-On-Insulator (SOI) CMOS technology as soft X-ray sensors for a future Japanese mission, FORCE (Focusing On Relativistic universe an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0964e071033f4e9c840a1f6fd8f03105
Publikováno v:
ICIS
This paper shows an EDCFG (extended differential control flow graph) to improve the accuracy of UCNs (update complexity numbers) that are utilized for the selection of existing test cases in regression testing.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe8fe053e0c030ee5b877f11497e3396
https://doi.org/10.1109/icis.2016.7550885
https://doi.org/10.1109/icis.2016.7550885
