Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Shunian Chen"'
Publikováno v:
Journal of Materials Research and Technology, Vol 28, Iss , Pp 2868-2875 (2024)
A reliable ultra-thin diffusion barrier is required for Cu interconnection. High entropy alloy (HEA) films have received attention in the development of diffusion barrier materials due to their remarkable properties. Here, the dense and smooth 17 nm
Externí odkaz:
https://doaj.org/article/5f8ce138f4df4656b66b6038f97ed858
Autor:
Shunian Chen, Weiqing Yan, Yifan Zhang, Lin Chen, Xiaoping Ouyang, Xiao Ouyang, Jing Chen, Bin Liao
Publikováno v:
Materials, Vol 16, Iss 16, p 5629 (2023)
AlCrTiZrMo high-entropy alloy (HEA) films with strong amorphization were obtained by co-filter cathode vacuum arc deposition, and the effect of thermal shock on the films was investigated in order to explore the protection mechanism of HEA films agai
Externí odkaz:
https://doaj.org/article/8ff37580465c4098b2f13840bc53c22e
Autor:
Yifan Zhang, Qian Li, Heng Yuan, Weiqing Yan, Shunian Chen, Menglin Qiu, Bin Liao, Lin Chen, Xiao Ouyang, Xu Zhang, Minju Ying
Publikováno v:
ACS Applied Materials & Interfaces. 14:21461-21473
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8fcb2448bfad57c9592cb699341394e
https://doi.org/10.1021/acsami.2c03123
https://doi.org/10.1021/acsami.2c03123
Autor:
Yiman Zhao, Weiqing Yan, Yujie Chen, Wenling Xie, Shunian Chen, Shuai Wu, Shu Wang, Jun Luo, Sam Zhang, Bin Liao
Publikováno v:
Surface and Coatings Technology. 459:129366
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::60b90d2c23e57baf308c6f909dcb94c4
https://doi.org/10.1016/j.surfcoat.2023.129366
https://doi.org/10.1016/j.surfcoat.2023.129366
Publikováno v:
SSRN Electronic Journal.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e81bd0930c5762b79003e848a4543814
https://doi.org/10.2139/ssrn.4017487
https://doi.org/10.2139/ssrn.4017487
Publikováno v:
ACS applied materialsinterfaces. 13(48)
Polymers used for the exteriors of spacecraft are always exposed to risks such as atomic oxygen (AO) or electrostatic discharge (ESD) degradation. In this work, an Al
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::838f1c6f01435c80bd65d6ff01d7d230
https://pubmed.ncbi.nlm.nih.gov/34843215
https://pubmed.ncbi.nlm.nih.gov/34843215
Autor:
Yifan Zhang, Heng Yuan, Weiqing Yan, Zhiqiang Zhang, Shunian Chen, Bin Liao, Xiao Ouyang, Lin Chen, Xu Zhang
Publikováno v:
Polymer Degradation and Stability. 205:110134
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::294ea3cfde45390ab8ad7d0e759e0227
https://doi.org/10.1016/j.polymdegradstab.2022.110134
https://doi.org/10.1016/j.polymdegradstab.2022.110134
Publikováno v:
Journal of Alloys and Compounds. 918:165749
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a86470778a3f872c35a03fc2f7abb299
https://doi.org/10.1016/j.jallcom.2022.165749
https://doi.org/10.1016/j.jallcom.2022.165749
Autor:
Weiqing Yan, Yiman Zhao, Yifan Zhang, Qian Li, Shunian Chen, Heng Yuan, Zhiqiang Zhang, Lin Chen, Jun Luo, Pan Pang, Guangyu He, Minju Ying, Bin Liao
Publikováno v:
Journal of Power Sources. 527:231217
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f79ca74991c20db1fb1a64bcf38272a0
https://doi.org/10.1016/j.jpowsour.2022.231217
https://doi.org/10.1016/j.jpowsour.2022.231217
Autor:
Chen, Shunian1,2 (AUTHOR) 18811573685@163.com, Yan, Weiqing1,2 (AUTHOR) 17862722263@163.com, Zhang, Yifan1,2 (AUTHOR) 202131220014@mail.bnu.edu.cn, Chen, Lin2 (AUTHOR), Ouyang, Xiaoping1 (AUTHOR) oyxp2003@aliyun.com, Ouyang, Xiao1 (AUTHOR) oyx16@tsinghua.org.cn, Chen, Jing3 (AUTHOR) sellenchenjing@aliyun.com, Liao, Bin1,2 (AUTHOR) sellenchenjing@aliyun.com
Publikováno v:
Materials (1996-1944). Aug2023, Vol. 16 Issue 16, p5629. 12p.