Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Shun Egusa"'
Autor:
Anthony K. Cheetham, Clare P. Grey, Robert J. Cava, Kent J. Griffith, Rogério M. Ribas, John B. Goodenough, Robson S. Monteiro, Yasuhiro Harada, Shun Egusa, Robert B. Von Dreele
Publikováno v:
Chemistry of Materials. 33:4-18
Lithium-ion batteries are essential for portable technology and are now poised to disrupt a century of combustion-based transportation. The electrification revolution could eliminate our reliance o...
Publikováno v:
Journal of The Electrochemical Society. 166:A1243-A1250
Autor:
Koji Takazawa, Satomi Naoi, Daikichi Mukoyama, Shun Egusa, Tokihiko Yokoshima, Satoru Ishikura, Tetsuya Osaka, Fujio Maeda, Koichi Yamamoto
Publikováno v:
Journal of Power Sources. 393:67-74
A system using a high-speed and high-precision X-ray inspection system for testing internal short circuits in lithium-ion batteries (LIBs) was firstly developed for the safety test on LIBs. X-ray transmission moving images of the anode and cathode we
Publikováno v:
Journal of the Japan Society of Applied Electromagnetics and Mechanics. 24:287-292
Autor:
Hidesato Saruwatari, Hiroki Inagaki, Yoshinao Tatebayashi, Keizoh Honda, Norio Takami, Shun Egusa
Publikováno v:
Journal of Power Sources. 244:469-475
Lithium-ion batteries with a combination of a lithium titanium oxide (LTO, Li4/3Ti5/3O4) anode and 4-volt-class cathodes, namely, LiMn2O4 (LMO) and LiNixCoyMn1-x-yO2 (NCM) cathode, have been developed for automotive and stationary power applications.
Publikováno v:
Journal of The Electrochemical Society; 2019, Vol. 166 Issue 6, pA1243-A1250, 8p
Publikováno v:
Synthetic Metals. 18:803-807
Photo-electrical studies were made for the characterization of metal-LB film interfaces. The threshold energies determined from the internal photoemission currents for the M-LB-M structures were independent of the electron affinities of the LB films
Publikováno v:
Japanese Journal of Applied Physics. 27:715
Non-Bragg reflection, which is observed prominently at low angles for Cd stearate Langmuir-Blodgett films, has been analyzed by a method which is a simple extension of the ordinary kinematical diffraction theory, and the applicability of the ordinary