Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Shuichi Katsui"'
Autor:
Takaaki Nagata, Shunpei Yamazaki, Yutaka Okazaki, Hideaki Shishido, Tomoya Aoyama, Hidetomo Kobayashi, Shuichi Katsui, Takashi Nakagawa, Yuki Tamatsukuri, Shogo Uesaka, Takayuki Ikeda
Publikováno v:
SID Symposium Digest of Technical Papers. 51:293-296
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83b1abe9ba496656373337ee50f58374
https://doi.org/10.1002/sdtp.13861
https://doi.org/10.1002/sdtp.13861
Autor:
Takayuki Ikeda, Takashi Nakagawa, Yutaka Okazaki, Shogo Uesaka, Hideaki Shishido, Shunpei Yamazaki, Shuichi Katsui, Hidetomo Kobayashi, Takaaki Nagata, Ryohei Yamaoka, Tomoya Aoyama, Kosei Nei, Yuki Tamatsukuri
Publikováno v:
Journal of the Society for Information Display. 27:497-506
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd9de253bcceeb00be6768a947fc3713
https://doi.org/10.1002/jsid.822
https://doi.org/10.1002/jsid.822
Autor:
Shogo Uesaka, Shunpei Yamazaki, Takashi Nakagawa, Yuki Tamatsukuri, Kosei Nei, Ryohei Yamaoka, Takayuki Ikeda, Yutaka Okazaki, Hideaki Shishido, Hidetomo Kobayashi, Tomoya Aoyama, Takaaki Nagata, Shuichi Katsui
Publikováno v:
SID Symposium Digest of Technical Papers. 50:311-314
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f57ddeae365617d8bb7b44ccce5567e8
https://doi.org/10.1002/sdtp.12918
https://doi.org/10.1002/sdtp.12918
Autor:
Shuichi Katsui, Shogo Uesaka, Ryohei Yamaoka, Yutaka Okazaki, Hideaki Shishido, Shunpei Yamazaki, Tomoya Aoyama, Hidetomo Kobayashi, Takaaki Nagata, Takashi Nakagawa, Yuki Tamatsukuri, Takayuki Ikeda
Publikováno v:
Proceedings of the International Display Workshops. :409
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b9649e0ea56a148897659df2dbab7b3
https://doi.org/10.36463/idw.2019.0409
https://doi.org/10.36463/idw.2019.0409
Autor:
Takuji Takahashi, Shuichi Katsui
Publikováno v:
Japanese Journal of Applied Physics. 50:08LB08
The photoabsorption properties of InAs wire structures have been investigated through photoinduced current (PIC) measurements by a dual light illumination method in scanning tunneling microscopy. On InAs wires with a width of around 50 nm, the depend
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::81bf549cca45df2d7f705bc9e34d1ca0
https://doi.org/10.1143/jjap.50.08lb08
https://doi.org/10.1143/jjap.50.08lb08
Autor:
Shuichi Katsui, Takuji Takahashi
Publikováno v:
Japanese Journal of Applied Physics. 48:08JB03
We propose a dual light illumination method in scanning tunneling microscopy (STM) for accurate characterization of photoabsorption properties of nanostructures on a substrate containing a depleted region and a consequent built-in field. In this meth
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09e921af84d794152659a7a577db2a1b
https://doi.org/10.1143/jjap.48.08jb03
https://doi.org/10.1143/jjap.48.08jb03