Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Shuan Ren"'
Autor:
Shuang Zhao, Shenglan Chen, Shuan Ren, Gang Li, Ke Song, Jie Guo, Shima Liu, Jian He, Xianwu Zhou
Publikováno v:
Journal of Renewable Materials. 11:2531-2553
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4094338ec6f604ea4a404a460c396041
https://doi.org/10.32604/jrm.2023.026066
https://doi.org/10.32604/jrm.2023.026066
Autor:
Shuan Ren, Manrong Zha, Youji Li, Ke Song, Jian He, Shima Liu, Jie Guo, Kegang Li, Xianwu Zhou
Publikováno v:
Journal of Wood Chemistry and Technology. 42:318-329
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9f378f51f53fed2ebe7baece3905fa19
https://doi.org/10.1080/02773813.2022.2088794
https://doi.org/10.1080/02773813.2022.2088794
Publikováno v:
Nuclear Physics B, Vol 903, Iss C, Pp 360-373 (2016)
In the probe limit, we numerically study the holographic p-wave superconductor phase transitions in the higher curvature theory. Concretely, we study the influences of Gauss–Bonnet parameter α on the Maxwell complex vector model (MCV) in the five-
Externí odkaz:
https://doaj.org/article/178010c49b234dea9e166b074d738de6
Publikováno v:
Nuclear Physics B, Vol 903, Iss C, Pp 360-373 (2016)
Nuclear Physics B
Nuclear Physics B
In the probe limit, we numerically study the holographic p -wave superconductor phase transitions in the higher curvature theory. Concretely, we study the influences of Gauss–Bonnet parameter α on the Maxwell complex vector model (MCV) in the five
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f7083ae2fc66883bf5cc1ccc011cbfea
http://www.sciencedirect.com/science/article/pii/S0550321316000110
http://www.sciencedirect.com/science/article/pii/S0550321316000110
Publikováno v:
Integrated Ferroelectrics. 163:1-7
Sn-doped AlN nanorod arrays were grown on Sillion substrate by doping of nonmagnetic element Sn via a catalyst-free chemical vapor deposition (CVD) method. X-ray diffraction (XRD), X-ray photoemission spectroscopy (XPS), scanning electron microscopy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e39f37297ac2afda29a637c551200bed
https://doi.org/10.1080/10584587.2015.1039911
https://doi.org/10.1080/10584587.2015.1039911