Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Shu-Cheng Chin"'
Autor:
Shu-Cheng Chin, 金書正
93
In this research, we compare the nanostructure and optical property of four InGaN/GaN multiple quantum well samples with different growth conditions. The quantum wells of three of these samples were grown at different temperatures. The incorp
In this research, we compare the nanostructure and optical property of four InGaN/GaN multiple quantum well samples with different growth conditions. The quantum wells of three of these samples were grown at different temperatures. The incorp
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/60034174771703640819
Autor:
Chun-Wei Chen, Cheng-Rong Hsing, Philipp Ebert, Shu Cheng Chin, Duc Long Nguyen, Bo Chao Huang, Rafal E. Dunin-Borkowski, Raman Sankar, Hung Chang Hsu, M. Schnedler, Ching-Ming Wei, Ya Ping Chiu
Publikováno v:
ACS nano 13(4), 4402-4409 (2019). doi:10.1021/acsnano.8b09645
Photodriven dipole reordering of the intercalated organic molecules in halide perovskites has been suggested to be a critical degree of freedom, potentially affecting physical properties, device performance, and stability of hybrid perovskite-based o
Autor:
Syu-You, Guan, Hsien-Shun, Liao, Bo-Jing, Juang, Shu-Cheng, Chin, Tien-Ming, Chuang, Chia-Seng, Chang
Publikováno v:
Ultramicroscopy. 196
Scanning tunneling microscope (STM) is a powerful tool for studying the structural and electronic properties of materials at the atomic scale. The combination of low temperature and high magnetic field for STM and related spectroscopy techniques allo
Autor:
Syu-You Guan, Chia-Seng Chang, Tien-Ming Chuang, Shu-Cheng Chin, Bo-Jing Juang, Hsien-Shun Liao
Scanning tunneling microscope (STM) is a powerful tool for studying the structural and electronic properties of materials at the atomic scale. The combination of low temperature and high magnetic field for STM and related spectroscopy techniques allo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5bb36c7c75f4a0d3a999c42ffbd7347d
http://arxiv.org/abs/1805.08121
http://arxiv.org/abs/1805.08121
Autor:
Wen-Yu Shiao, Chun-Yung Chi, Shu-Cheng Chin, Chi-Feng Huang, Tsung-Yi Tang, Yen-Cheng Lu, Yu-Li Lin, Lin Hong, Fang-Yi Jen, C. C. Yang, Bao-Ping Zhang, Segawa, Yusaburo
Publikováno v:
Journal of Applied Physics; 3/1/2006, Vol. 99 Issue 5, p054301, 6p, 6 Black and White Photographs, 5 Graphs
Autor:
Kung-Jen Ma, Yusaburo Segawa, Y. H. Lin, Shu-Cheng Chin, Fang-Yi Jen, Jer-Ren Yang, Lin Hong, Yen-Cheng Lu, Chih-Chung Yang, Baoping Zhang, Chun-Yung Chi
Publikováno v:
Journal of Crystal Growth. 293:344-350
We compared the nano-structures of three samples of ZnO thin film on sapphire under different growth temperature conditions. Although disconnected domain structures (on the scale of 100 nm in size) were observed in the samples of high-temperature (45
Autor:
Hung-Chang Hsu, Bo-Chao Huang, Shu-Cheng Chin, Cheng-Rong Hsing, Duc-Long Nguyen, Schnedler, Michael, Sankar, Raman, Dunin-Borkowski, Rafal E., Ching-Ming Wei, Chun-Wei Chen, Ebert, Philipp, Ya-Ping Chiu
Publikováno v:
ACS Nano; 4/23/2019, Vol. 13 Issue 4, p4402-4409, 8p
Autor:
Fang-Yi Jen, Chih-Chung Yang, Baoping Zhang, Chun-Yung Chi, Shu-Cheng Chin, Yusaburo Segawa, Y. H. Lin, Yen-Cheng Lu, Lin Hong
Publikováno v:
Nanotechnology. 16:3084-3091
We compared the nano-structures of three samples of ZnO thin films grown on GaN with different growth temperature conditions. Although disconnected spiral domain structures (of the order of 100?nm in width) were observed in the samples of high-temper
Autor:
Hung-Pin Chen, Yuan-Chih Chang, Yu-Chieh Wen, Chia-Seng Chang, Li-Wei Tu, Kung-Hsuan Lin, Ching-Lien Hsiao, Chi-Kuang Sun, Shu-Cheng Chin, Yuan-Ting Lin, Chia-Lung Hsieh
Publikováno v:
Physical Review Letters. 103
We report a direct determination of the specular scattering probability of acoustic phonons at a crystal boundary by observing the escape of incident coherent phonons from the coherent state during reflection. In the sub-THz frequency range where the
Publikováno v:
Nanotechnology. 21(5)
In this study, we demonstrate a high-resolution friction profiling technique using synchronous atomic/lateral force microscopy (AFM/LFM). The atomic resolution is achieved by our special carbon nanotube (CNT) probes made via in situ tailoring and man