Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Shturbin, A."'
Publikováno v:
In Materials Science in Semiconductor Processing 6 February 2001 4(1-3):205-207
Autor:
Jürgen Härtwig, M. Ohler, A. V. Shturbin, I. V. Grekhov, T. V. Kudryavtseva, Tatiana S. Argunova, L. S. Kostina, M. Yu. Gutkin, R. F. Vitman, Eun Dong Kim, S. Ch. Kim
Publikováno v:
Physics of the Solid State. 41:1790-1798
The elastically strained state of the interface in directly-bonded silicon structures has been studied by x-ray diffraction topography and IR spectrometry. The pattern of the contrast observed in the x-ray topographs and the intensity oscillations in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9dd05f30db98a88d4b9a912e325808c9
https://doi.org/10.1134/1.1131099
https://doi.org/10.1134/1.1131099
Publikováno v:
Materials Science in Semiconductor Processing. 4:205-207
In this paper, we present a simple non-destructive method for testing SiC plate single crystals of any size and shape. The method is based on measuring the impedance changes of an inductive ferrite-cored coil due to placing the sample into the core g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6b833d94e2fa1fd813ca08e0b7d43a35
https://doi.org/10.1016/s1369-8001(00)00105-0
https://doi.org/10.1016/s1369-8001(00)00105-0
Publikováno v:
Conference Digest. 2000 Conference on Lasers and Electro-Optics Europe (Cat. No.00TH8505).
Summary form only. At present the better part of coordinate-sensitive photodetectors is based on longitudinal photo-voltage effect in p-n junction. The linear range of their sensitivity via coordinate of illuminated region is limited by the diffusion
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4af359d90bbdc19a5565f755ec547979
https://doi.org/10.1109/cleoe.2000.910149
https://doi.org/10.1109/cleoe.2000.910149
Publikováno v:
Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering.
In this paper we present a simple non-destructive method for testing SiC plate single-crystals of any size and shape. Themethod is based on measuring the impedance changes of an inductive ferrite-cored coil due to placing the sample into thecore gap.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ff4d6921f3cf9873395dab36bd20bdf
https://doi.org/10.1117/12.417637
https://doi.org/10.1117/12.417637
Publikováno v:
Conference Digest. 2000 Conference on Lasers and Electro-Optics Europe (Cat. No.00TH8505).
Summary form only given. A simple non-destructive method for characterising SiC samples (Lely-crystals, CREE-substrates, and epitaxial films) is presented. The observed ultraviolet differential reflection spectra of SiC samples were compared with a p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::592d4978320bd92b888eeb80d07175a3
https://doi.org/10.1109/cleoe.2000.910130
https://doi.org/10.1109/cleoe.2000.910130
Autor:
Shturbin, Anatoly V., Titkov, Ilya E., Panevin, Vadim Y., Vorobjev, Leonid E., Witman, Renata F.
Publikováno v:
Proceedings of SPIE; Nov2000, Issue 1, p51-55, 5p
Akademický článek
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Publikováno v:
Proceedings of SPIE; Nov2001, Issue 1, p135-137, 3p
Publikováno v:
Physica Status Solidi (B); Sep1972, Vol. 53 Issue 1, p47-54, 8p