Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Shreeya Garg"'
Publikováno v:
IEEE Access, Vol 11, Pp 57880-57894 (2023)
The alarming annual growth in the number of people affected by Major Depressive Disorder (MDD) is a problem on a global scale. In the primary scrutiny of depression, Electroencephalography (EEG) is one of the analytical tools available. Machine Learn
Externí odkaz:
https://doaj.org/article/2d59d43a0dc84c62980818fa7b697cd1
Autor:
Patrick K. Tumwebaze, Melissa D. Conrad, Martin Okitwi, Stephen Orena, Oswald Byaruhanga, Thomas Katairo, Jennifer Legac, Shreeya Garg, David Giesbrecht, Sawyer R. Smith, Frida G. Ceja, Samuel L. Nsobya, Jeffrey A. Bailey, Roland A. Cooper, Philip J. Rosenthal
Publikováno v:
Nature Communications, Vol 13, Iss 1, Pp 1-12 (2022)
In this work, susceptibilities to two key antimalarials, dihydroartemisinin and lumefantrine, were associated with multiple genetic polymorphisms in Plasmodium falciparum, and were lower in northern Uganda, where resistance-mediating mutations have e
Externí odkaz:
https://doaj.org/article/187a57e02f454e7cb07950de76fde6a6
Publikováno v:
PLoS ONE, Vol 16, Iss 3, p e0241529 (2021)
Host-associated microbiomes can play important roles in the ecology and evolution of their insect hosts, but bacterial diversity in many insect groups remains poorly understood. Here we examine the relationship between host environment, host traits,
Externí odkaz:
https://doaj.org/article/7cd1d7e5e39042398bb47bc3818aa94a
Autor:
Urvashi Prakash Shukla, Shreeya Garg
Publikováno v:
Cognitive Sensors, Volume 2 ISBN: 9780750353465
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c9b0481563b8af50dd2c178ced650a7
https://doi.org/10.1088/978-0-7503-5346-5ch3
https://doi.org/10.1088/978-0-7503-5346-5ch3
Publikováno v:
2022 IEEE International Symposium on Smart Electronic Systems (iSES).
Publikováno v:
Proceedings of the 14th International Conference on Education Technology and Computers.
Autor:
Urvashi Prakash Shukla, Shreeya Garg
Publikováno v:
2022 International Conference on Engineering and Emerging Technologies (ICEET).
Autor:
Shreeya Garg, Oriana Kreutzfeld, Sevil Chelebieva, Patrick K. Tumwebaze, Oswald Byaruhanga, Martin Okitwi, Stephen Orena, Thomas Katairo, Samuel L. Nsobya, Melissa D. Conrad, Ozkan Aydemir, Jennifer Legac, Alexandra E. Gould, Brett R. Bayles, Jeffrey A. Bailey, Maelle Duffey, Gang Lin, Laura A. Kirkman, Roland A. Cooper, Philip J. Rosenthal
Publikováno v:
Antimicrobial agents and chemotherapy, vol 66, iss 10
Antimicrob Agents Chemother
Antimicrob Agents Chemother
The proteasome is a promising target for antimalarial chemotherapy. We assessed ex vivo susceptibilities of fresh Plasmodium falciparum isolates from eastern Uganda to seven proteasome inhibitors: two asparagine ethylenediamines, two macrocyclic pept
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::68bc34406b4545749259203028861266
https://escholarship.org/uc/item/8dm1n152
https://escholarship.org/uc/item/8dm1n152
Autor:
Patrick Tumwebaze, Melissa Conrad, Martin Okitwi, Stephen Orena, Oswald Byaruhanga, Thomas Katairo, Jenny Legac, Shreeya Garg, David Giesbrecht, Sawyer Smith, Frida Ceja, Samuel Nsobya, Jeffrey Bailey, Roland Cooper, Philip Rosenthal
Artemisinin resistance may facilitate selection of Plasmodium falciparum resistant to combination therapy partner drugs. We evaluated 99 P. falciparum isolates collected in 2021 from northern Uganda, where resistance-associated PfK13 C469Y and A675V
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1843d0f60c16163d4b1126aa678f9d65
https://doi.org/10.21203/rs.3.rs-1789814/v1
https://doi.org/10.21203/rs.3.rs-1789814/v1
Autor:
Urvashi Prakash Shukla, Shreeya Garg
The article designs an approach for the detection of MDD using spectral clustering. The raw EEG is pre-processed, and then three quantitative biomarkers: band power (beta, delta, and theta) along with three signal-extracted signals: Detrended Fluctua
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e8cde12d6d6dd3ba3bbe5f2f34d8598d
https://doi.org/10.36227/techrxiv.19654026.v1
https://doi.org/10.36227/techrxiv.19654026.v1