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pro vyhledávání: '"Shogo Awata"'
Publikováno v:
Journal of Electron Microscopy. 48:569-573
Autor:
Tomohiko Iijima, Shinichi Ogawa, Toshihiko Kanayama, Shogo Awata, Shintaro Komatani, Shigeru Kakinuma
Publikováno v:
2011 IEEE International Interconnect Technology Conference.
Several novel imaging modes of the recently developed helium ion microscope (HIM) 1) were explored that may make the HIM a tool of particular value to Cu / low-k (dielectric constant) interconnect structures. Mechanism of the “through dielectric”