Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Shiyu Sang"'
Publikováno v:
Microelectronics Reliability. 81:320-327
Potential-induced degradation (PID) has caught considerable attention in recent years because of its detrimental influence on output power of solar module and energy yield of photovoltaic power plant. In this paper, performance variation of dark curr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a9f7995759195a4f748b209c866412a4
https://doi.org/10.1016/j.microrel.2017.11.003
https://doi.org/10.1016/j.microrel.2017.11.003
Publikováno v:
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC).
A primary reference cell calibration testbed using direct normal irradiance calibration method is developed to establish calibration traceability chain of PV scale by Institute of Electrical Engineering (IEECAS) and New Energy Research and Demonstrat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ddf60fa9f6ced50df2f782ae6eb26d21
https://doi.org/10.1109/pvsc.2017.8366208
https://doi.org/10.1109/pvsc.2017.8366208
Autor:
Shiyu Sang, Bojie Su, Hui Zhao, He Wang, Shuwen Guo, Xue Zhang, Hong Yang, Yunxue Cao, Pan Zhao, Weijing Huang
Publikováno v:
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC).
In this paper, the I-V characteristics of PID-affected solar modules were investigated under illuminated and dark conditions. Based on the measured data, it is found that the I-V characteristic of PID-affected modules shows a regular change under dif
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67a6fbc2a2154a7b36efee8078afa34e
https://doi.org/10.1109/pvsc.2017.8366716
https://doi.org/10.1109/pvsc.2017.8366716
Autor:
Xue Zhang, Shuwen Guo, Hong Yang, Bojie Su, He Wang, Dengyuan Song, Yunxue Cao, Hui Zhao, Pan Zhao, Shiyu Sang
Publikováno v:
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC).
This paper focuses on thermal characteristics of PID-affected solar modules under illuminated and dark conditions by thermographic images. It is found that the temperature of PID-affected module becomes higher under negative bias when the sequence of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::27c3e8bc412c082fecfef4a41f4fe395
https://doi.org/10.1109/pvsc.2017.8366470
https://doi.org/10.1109/pvsc.2017.8366470
Publikováno v:
New Energy and Sustainable Development.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a47ea931d1843fe8f55ba8d1bec4abc0
https://doi.org/10.1142/9789813142589_0003
https://doi.org/10.1142/9789813142589_0003
Publikováno v:
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).
The proficiency testing for PV reference cells is to confirm technical competence of calibration organizations in the world. Over past 2 years, the first proficiency testing program for PV reference cells calibration was held by AIST. In this paper,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::028d6fce7b6f3c4e74520cf2cbd7e2b2
https://doi.org/10.1109/pvsc.2015.7355848
https://doi.org/10.1109/pvsc.2015.7355848
Publikováno v:
2011 37th IEEE Photovoltaic Specialists Conference.
To assess electrical and reliability performance of CPV modules of China, a test bed of CPV module I-V characteristics is established in the Institute of Electrical Engineering of Chinese Academy of Sciences in Beijing. The relative and absolute outp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::948b0e2add69bbef8b02dae736e3385b
https://doi.org/10.1109/pvsc.2011.6186416
https://doi.org/10.1109/pvsc.2011.6186416
Publikováno v:
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC); 2015, p1-5, 5p