Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Shiu Fai Li"'
Autor:
Zipeng Xu, Christopher M. Hefferan, Shiu Fai Li, Jonathan Lind, Robert M. Suter, Fadi Abdeljawad, Gregory S. Rohrer
Publikováno v:
Scripta Materialia. 230:115405
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ef7bbb6a56d7a5821b70765708fda4a
https://doi.org/10.1016/j.scriptamat.2023.115405
https://doi.org/10.1016/j.scriptamat.2023.115405
Autor:
Menasche, David B., Lind, Jonathan, Shiu Fai Li, Kenesei, Peter, Bingert, John F., Lienert, Ulrich, Suter, Robert M.
Publikováno v:
Journal of Applied Physics; 2016, Vol. 119 Issue 15, p154902-1-154902-7, 7p
Autor:
C. M. Hefferan, Shiu-Fai Li, Ulrich Lienert, Reeju Pokharel, Jonathan Lind, Anthony D. Rollett, Robert M. Suter
Publikováno v:
ICIP
Comparisons between experiments and simulations of deformation of polycrystalline materials reveal some interesting challenges [1]. Addressing first the image processing issues, electron back-scatter diffraction (EBSD) [2] relies heavily on image tra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4fabdf310b830125a79edf05c25a296c
https://doi.org/10.1109/icip.2014.7025988
https://doi.org/10.1109/icip.2014.7025988
Autor:
Shade, Paul A., Blank, Basil, Schuren, Jay C., Turner, Todd J., Kenesei, Peter, Goetze, Kurt, Suter, Robert M., Bernier, Joel V., Shiu Fai Li, Lind, Jonathan, Lienert, Ulrich, Almer, Jonathan
Publikováno v:
Review of Scientific Instruments; Sep2015, Vol. 86 Issue 9, p1-8, 8p, 5 Color Photographs, 1 Graph
Autor:
Spear, Ashley D.1 ads259@cornell.edu, Shiu Fai Li2, Lind, Jonathan F.3, Suter, Robert M.3, Ingraffea, Anthony R.1
Publikováno v:
Acta Materialia. Sep2014, Vol. 76, p413-424. 12p.