Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Shishir Ray"'
Autor:
Ashwini Chandrashekar, Jinping Liu, Bharat Krishnan, M. Gribelyuk, A. Zainuddin, Kassim Joseph K, T. J. Tang, Zhiguo Sun, J. Yang, Eswar Ramanathan, Shishir Ray, Ritesh Ray Chaudhuri, Tian Shen, Jay Mody, Huang Liu, Anbu Selvam Km Mahalingam, Kong Boon Yeap, Linjun Cao, Rinus T. P. Lee, Ryan Sporer, D. Damjanovic, N. Petrov
Publikováno v:
2018 IEEE Symposium on VLSI Technology.
Nanosecond laser-induced grain growth in Cu interconnects is demonstrated for the first time using 14nm FinFET technology. We achieved a 35% reduction in Cu interconnect resistance, which delivers a 15% improvement in RC and a gain of 2 – 5% in I D
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0dd407cc68abf63f0ac888a120bb66aa
https://doi.org/10.1109/vlsit.2018.8510651
https://doi.org/10.1109/vlsit.2018.8510651
Autor:
Felipe Tijiwa-Birk, Brian A. Cohen, Shishir Ray, K. K. Kohli, Siddarth A. Krishnan, Joyeeta Nag, C. Parks, Andrew H. Simon
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 28:469-473
Alloy seedlayers for copper back-end of line interconnects have become common at technology groundrules of 45 nm and below, due to reliability requirements. The key requirement of the minority alloy component (e.g., Al or manganese, also referred to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d3808584af14cd4a26a1516f62a9ac5
https://doi.org/10.1109/tsm.2015.2480037
https://doi.org/10.1109/tsm.2015.2480037
Autor:
Richard G. Southwick, Mohit Bajaj, Eduard A. Cartier, A. Dasgupta, Takashi Ando, Oleg Gluschenkov, Unoh Kwon, Vijay Narayanan, Jinping Liu, Marinus Hopstaken, W.L. Chang, Siddarth A. Krishnan, Shishir Ray, Miaomiao Wang, James H. Stathis, Rajan K. Pandey, Tenko Yamashita, Barry P. Linder
Publikováno v:
2016 IEEE International Reliability Physics Symposium (IRPS).
Bias Temperature Instability (BTI) is a tremendous reliability concern for deeply scaled CMOS technologies, and is the limiting mechanism for further inversion layer thickness (Tinv) scaling for future nodes [1]. Replacement Metal Gate technologies a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05871b2009b497e6ca207ca85519472c
https://doi.org/10.1109/irps.2016.7574532
https://doi.org/10.1109/irps.2016.7574532
Autor:
Felipe Tijiwa-Birk, Shishir Ray, Kriti Kohli, Joyeeta Nag, Christopher Parks, Siddarth A. Krishnan, Andrew H. Simon
Publikováno v:
25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014).
Alloy seedlayers for Cu BEOL interconnects have become common at technology groundrules of 45 nm and below, due to reliability requirements. The key requirement of the minority alloy component (e.g., Al or Mn, also referred to as the “dopant”) is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a1bd626837c9b34a0696c0c06803990
https://doi.org/10.1109/asmc.2014.6847017
https://doi.org/10.1109/asmc.2014.6847017
Autor:
Mark S. Williamsen, John A. Dudek, Mark Bissen, Somaditya Sen, V. R. Palkar, Laura Kretsch, Prasenjit Guptasarma, Marshall Onellion, Ying Zou, Shishir Ray
Publikováno v:
IndraStra Global.
Spectroscopic studies are rarely performed at very high temperature, especially when combined with light from a synchrotron source. Demanding conditions of maintaining ultrahigh vacuum (UHV) during heating, together with the typically brief access to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8f098517515a98d72a90c07d35567c6d
http://dspace.library.iitb.ac.in/jspui/handle/100/13829
http://dspace.library.iitb.ac.in/jspui/handle/100/13829
Autor:
Ying Zou, Shishir Ray, Somaditya Sen, Mark S. Williamsen, Larry Buroker, Prasenjit Guptasarma
Publikováno v:
Scopus-Elsevier
TbMnO3 is a multiferroic magnetoelectric material known to simultaneously exhibit antiferromagnetism below 40K and ferroelectricity below 28K in the same crystalline phase [1]. Following interesting results of Cu substitution in LaMn1-yCuyO3 [2, 3],
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2b3d94a2de9ec6fb5ee6bd590e0cecff
https://doi.org/10.1557/proc-1199-f06-28
https://doi.org/10.1557/proc-1199-f06-28
Publikováno v:
MRS Proceedings. 848
In this MRS Proceedings paper, we present a review of the floating zone growth process, and describe growth techniques as relevant to four selected families of current or continued interest in the area of condensed matter physics of highly correlated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b175a2805be168375abedf9c355981d9
https://doi.org/10.1557/proc-848-ff10.3
https://doi.org/10.1557/proc-848-ff10.3
Autor:
Soma Chattopadhyay, M. Balasubramanian, Prasenjit Guptasarma, Marija Gajdardziska-Josifovska, Marvin A. Schofield, Tomohiro Shibata, Yang Ren, Ying Zou, Somaditya Sen, Shishir Ray
Publikováno v:
Microscopy and Microanalysis. 18:1896-1897
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2563d586c2f5e55d3b8e2d6c878149d9
https://doi.org/10.1017/s1431927612011336
https://doi.org/10.1017/s1431927612011336
Autor:
Ying Zou, Somaditya Sen, Donald Robertson, Marija Gajdardziska-Josifovska, Prasenjit Guptasarma, Shishir Ray
Publikováno v:
Microscopy and Microanalysis. 16:1720-1721
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f3dc35ee4e9bc12249f2c415843b81ba
https://doi.org/10.1017/s1431927610062367
https://doi.org/10.1017/s1431927610062367
Autor:
Larry Buroker, Mark S. Williamsen, Ying Zou, Somaditya Sen, Shishir Ray, Prasenjit Guptasarma
Publikováno v:
Scopus-Elsevier
Dr. SOMADITYA SEN
Dr. SOMADITYA SEN
We clarify here certain aspects of the magnetic field (H) – temperature (T) phase diagram of YbMnO3, a hexagonal Rare-Earth manganite oxide in which two multiferroic ordered states – ferroelectricity and antiferromagnetism coexist at low temperat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6530059267fcbe1ba4201557c24f9fb1
http://www.scopus.com/inward/record.url?eid=2-s2.0-77950974926&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-77950974926&partnerID=MN8TOARS
