Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Shirley Turner"'
Autor:
Sanyuan Yang, Gordon J. Kennedy, W.G. Borghard, Robert A. Fletcher, Anthony F. Marlow, T.W. Vetter, John R. Sieber, Jennifer R. Verkouteren, Alexandra Navrotsky, M.G. Moreno-Ramirez, Rolf Zeisler, Stefan D. Leigh, J.F. Kelly, Mark E. Davis, Brian H. Toby, Shirley Turner, Eric S. Windsor
Publikováno v:
Microporous and Mesoporous Materials. 107:252-267
Zeolites have important industrial applications including use as catalysts, molecular sieves and ion exchange materials. In this study, three zeolite materials have been characterized by the National Institute of Standards and Technology (NIST) as re
Autor:
Christopher B. Montgomery, Shirley Turner, Michael R. Zachariah, Richard E. Cavicchi, Prahalad M. Parthangal
Publikováno v:
Journal of Materials Research. 20:2889-2894
We report on the growth of nanowires and unusual hollow microducts of tungsten oxide by thermal treatment of tungsten films in a radio frequency H2/Ar plasma at temperatures between 550 and 620 °C. Nanowires with diameters of 10–30 nm and lengths
Publikováno v:
Nanotechnology. 15:62-65
A 340-element array of microhotplates was used to characterize the chemical vapour deposition growth of carbon nanotubes and nanofibres under a variety of process conditions. One dimension of the 17 by 20 element array was used to vary the thickness
Autor:
Michael R. Winchester, Nicholas W. M. Ritchie, John A. Small, Dale E. Newbury, Lee J. Richter, Shirley Turner, Keana C. Scott, Rick L. Paul, Douglas C. Meier, Donna B. Klinedinst, Stefan D. Leigh, Savelas A. Rabb, Ryna B. Marinenko, Lee L. Yu, Rolf Zeisler, David S. Simons
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 16(1)
Bulk silicon-germanium (SiGe) alloys and two SiGe thick films (4 and 5 μm) on Si wafers were tested with the electron probe microanalyzer (EPMA) using wavelength dispersive spectrometers (WDS) for heterogeneity and composition for use as reference m
Accuracy of transmission electron microscopy analysis for asbestos on filters: interlaboratory study
Autor:
Shirley Turner, Eric B. Steel
Publikováno v:
Analytical Chemistry. 63:868-872
Replica sections were prepared from a single polycarbonate filter that had chrysotile and several types of non-asbestos particles deposited on its surface. Twenty-seven analysts from 15 laboratories counted a minimum of 3 grid squares and recorded th
Autor:
Dale E. Newbury, Shirley Turner, David S. Simons, Rolf Zeisler, Lee J. Richter, Ryna B. Marinenko, Lee L. Yu
Publikováno v:
Microscopy and Microanalysis. 11
Publikováno v:
AIP Conference Proceedings.
Bulk SiGe wafers cut from single‐crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro‐ and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the
Autor:
Shirley Turner, David S. Bright
Publikováno v:
MRS Proceedings. 703
Faceting in a polyhedral rutile particle was modeled from transmission electron microscopy images. A double-tilt, rotate transmission electron microscope (TEM) sample holder was used to manipulate the particle. Using this holder, it was possible to a
Autor:
Shirley Turner
Publikováno v:
MRS Proceedings. 581
Rutile nanoparticles containing voids or cavities have been characterized using transmission electron microscopy. The general morphology of the voids has been determined from images of nanoparticles in different orientations. In general, the longest
Publikováno v:
MRS Proceedings. 457
Nanophase TiO2 (n-TiO2) particles were generated in a flame burner system under three experimental conditions. Selected individual nanoparticles were identified and characterized using selected area electron diffraction, bright-field and, in some cas