Zobrazeno 1 - 10
of 57
pro vyhledávání: '"Shinya Nunoue"'
Publikováno v:
physica status solidi (a).
Publikováno v:
2019 Compound Semiconductor Week (CSW).
Epitaxial growth of GaN on Si substrates has been regarded as attractive technology to realize low-cost GaN-based optical and electronic devices. With regard to the practical application of GaN-on-Si, fabrication of thick-GaN layer with low-threading
Autor:
Aya Shindome, Toshiki Hikosaka, A. Mukai, Shinya Nunoue, Daimotsu Kato, Masahiko Kuraguchi, Hiroshi Ono, Yosuke Kajiwara
Publikováno v:
2019 Compound Semiconductor Week (CSW).
The channel mobility and positive bias temperature instability is improved by the additional two processes of the gate structures in recessed normally-off GaN-MOSFETs. The one is the surface treatment for removal of the damage by the recess etching.
Publikováno v:
Journal of Applied Physics; 2016, Vol. 120 Issue 11, p113104-1-113104-12, 12p, 1 Color Photograph, 2 Black and White Photographs, 2 Charts, 9 Graphs
Publikováno v:
physica status solidi (a). 213:1177-1180
GaN-based multijunction light-emitting diodes (MJ-LEDs) capable of operating at high voltage and high power were fabricated. The device structure of the MJ-LEDs was based on a thin-film flip-chip LED and consisted of several junctions connected in se
Autor:
Yosuke Kajiwara, Akira Mukai, Hiroshi Ono, Shinya Nunoue, Masahiko Kuraguchi, Jumpei Tajima, Aya Shindome, Toshiki Hikosaka, Daimotsu Kato
Publikováno v:
Japanese Journal of Applied Physics. 59:SGGD13
Publikováno v:
physica status solidi (b). 252:917-922
We investigated the relaxation behavior of InGaN/GaN blue multiple quantum wells (MQWs) grown on Si (111) and sapphire (0001) substrates to determine how the threading dislocation density (TDD) in the underlying GaN layer, the thickness of the MQWs,
Autor:
Toshihide Ito, Shinya Nunoue
Publikováno v:
physica status solidi (b). 252:1011-1016
When n-GaN surface is treated by BCl3/Ar plasma, the Schottky barrier height (SBH) of Pt, Ni, or Ag/n-GaN is decreased, whereas that of Al/n-GaN is increased. The slope parameter is decreased by the BCl3/Ar plasma treatment, indicating that the Fermi
Autor:
Aya Shindome, Masahiko Kuraguchi, Yosuke Kajiwara, Kenjiro Uesugi, Toshiya Yonehara, Shinya Nunoue, Daimotsu Kato, H. Saito, Akira Yoshioka
Publikováno v:
Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials.
Publikováno v:
physica status solidi c. 11:628-631
High-efficiency yellow InGaN-based light-emitting diodes (LEDs) were grown by metal-organic chemical vapor deposition on conventional c-plane sapphire (0001) substrates. Optimization of the growth temperature of barrier layers eliminated surface incl