Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Shinkichi Hamada"'
Autor:
Yuya Sano, Yudai Takemoto, F. Komori, Takeyoshi Kato, Shinkichi Hamada, Yasuo Suzuoki, Muneaki Kurimoto, Yukio Sasatani
Publikováno v:
2020 8th International Conference on Condition Monitoring and Diagnosis (CMD).
Film power capacitors are made out of polypropylene (PP) films co-wound with Al foil electrodes, impregnated with insulating oil. In a void, if any, or around the electrode edge, partial discharges (PDs) occur, leading to PP film deterioration and ev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91c79877140c01ba71362b502ad1a233
https://doi.org/10.1109/cmd48350.2020.9287234
https://doi.org/10.1109/cmd48350.2020.9287234
Autor:
Takeyoshi Kato, F. Komori, Ryouhei Yano, Shintarou Ogura, Muneaki Kurimoto, Yuuya Sano, Shinkichi Hamada, Tomohiro Kawai, Yasuo Suzuoki, Yukio Sasatani, Toshihisa Funabashi
Publikováno v:
2017 International Symposium on Electrical Insulating Materials (ISEIM).
The authors have been investigating the deterioration characteristics of polypropylene (PP) films due to partial discharge (PD) in a closed void as a basic study of longterm deterioration of power capacitors. We reported that (1) the number of PD pul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d105e5b297a199136064d9db4f8e89d
https://doi.org/10.23919/iseim.2017.8088768
https://doi.org/10.23919/iseim.2017.8088768
Autor:
Toru Matsunami, Nobuhiko Nakamura, Yoshitaka Setoguchi, Hirofumi Aoki, Hisashi Yoshioka, Hiroshi Kawami, Shinkichi Hamada, Noboru Ohtani, Koichi Nishikawa, Toshiyuki Isshiki, Satoshi Yamaguchi
Publikováno v:
ECS Journal of Solid State Science and Technology. 2:N3092-N3097
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0aeb12da9903dbfe0c18fdc2c488fe7b
https://doi.org/10.1149/2.018308jss
https://doi.org/10.1149/2.018308jss
Autor:
Toru Matsunami, Hisashi Yoshioka, Toshiyuki Isshiki, Nobuhiko Nakamura, Hiroshi Kawami, Shinkichi Hamada, Kimito Nishikawa, Yoshitaka Setoguchi
Publikováno v:
Materials Science Forum. 725:31-34
We have been trying to improve a quality of crystal, using the metastable solvent epitaxy (MSE) method, one of the solution methods. In MSE, a Frank-type fault is formed by conversion of a threading screw dislocation (TSD) in the substrate. To study
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef152239123671466a9ca8481c3b7391
https://doi.org/10.4028/www.scientific.net/msf.725.31
https://doi.org/10.4028/www.scientific.net/msf.725.31
Autor:
Hiroshi Yamada-Kaneta, Akira Sakai
Selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-14), September 25-29, 2011, Miyazaki, Japan
