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Publikováno v:
Hyomen Kagaku. 15:335-339
The discrete variational (DV)-Xα cluster model is used to study the surface structure of Ge film which developed on Si (001) substrate using Te as a surfactant. The X-ray photoelectron spectra were calculated and compared with experimental data. Fro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5e6ebafaeabb6ae3f869e8fd29f8c29
https://doi.org/10.1380/jsssj.15.335
https://doi.org/10.1380/jsssj.15.335
