Zobrazeno 1 - 10
of 76
pro vyhledávání: '"Shin， Eun-sol"'
Autor:
Arivunithi, Veera Murugan, Kim, Soohyun, Choi, Jungmin, Sung, Jong Hun, Yoo, Hyun Deog, Shin, Eun-Sol, Noh, Yong-Young, Gal, Yeong-Soon, Lee, Hyunjung, Jin, Sung-Ho
Publikováno v:
In Organic Electronics November 2020 86
Autor:
Opoku, Henry, Bathula, Chinna, Shin, Eun-Sol, Long, Dang Xuan, Kong, Hoyoul, Jung, Yu Jin, Lim, Bogyu, Noh, Yong-Young
Publikováno v:
In Organic Electronics March 2020 78
Publikováno v:
In Organic Electronics April 2018 55:6-14
Autor:
Shin, Eun-Sol, Noh, Yong-Young
Publikováno v:
In Organic Electronics February 2018 53:111-116
Publikováno v:
In Organic Electronics February 2017 41:198-204
Autor:
Park, Noh-Hwal, Shin, Eun Sol, Ryu, Gi-Seong, Kwon, Jimin, Ji, Dongseob, Park, Hyunjin, Kim, Yun Ho, Noh, Yong-Young
Publikováno v:
Journal of Information Display. 24:109-118
Single wall carbon nanotubes (SWNT) have been a significant research topic as active layers for thin film transistors (TFTs) due to their high charge carrier mobility beyond that of crystalline silicon. In this study, we report an effective approach
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::918e5ef2e62a160b81562612fb3fbbc4
https://doi.org/10.1080/15980316.2022.2141362
https://doi.org/10.1080/15980316.2022.2141362
Autor:
Park, Noh-Hwal, Shin, Eun Sol, Ryu, Gi-Seong, Kwon, Jimin, Ji, Dongseob, Park, Hyunjin, Kim, Yun Ho, Noh, Yong-Young
Publikováno v:
Journal of Information Display; Jun2023, Vol. 24 Issue 2, p109-118, 10p
Publikováno v:
In Organic Electronics October 2012 13(10):2192-2200
Autor:
Kim， Jeong-Ryeol, Shin， Eun-sol
Publikováno v:
The Journal of Mirae English Language and Literature. 25:163-189
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8117f24f9697f3877f1d05dcd15f3b5
https://doi.org/10.46449/mjell.2020.05.25.2.163
https://doi.org/10.46449/mjell.2020.05.25.2.163
Publikováno v:
STEM Journal. 19:181-202
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8a602c35bdc58ff35176cfa28451df5
https://doi.org/10.16875/stem.2018.19.1.181
https://doi.org/10.16875/stem.2018.19.1.181