Zobrazeno 1 - 10
of 32 393
pro vyhledávání: '"Shin, W"'
Autor:
Sang Yoon Park, Wonkyo Shin, Myong Cheol Lim, Sang-Soo Seo, Sokbom Kang, Yedong Son, Gowoon Jeong
Publikováno v:
International Journal of Environmental Research and Public Health, Vol 18, Iss 4043, p 4043 (2021)
International Journal of Environmental Research and Public Health
International Journal of Environmental Research and Public Health
The authors would like to add the following information to the “Funding” section of their paper published in the International Journal of Environmental Research and Public Health [...]
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::168ee5f1c146f46faa2ee65c70a12421
https://www.mdpi.com/1660-4601/18/8/4043
https://www.mdpi.com/1660-4601/18/8/4043
Publikováno v:
In Journal of Mathematical Analysis and Applications 15 September 2024 537(2)
Autor:
Kim J; Department of Electronic Engineering, Hanyang University, Seoul, 04763, Republic of Korea.; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Park EC; Department of Electronic Engineering, Hanyang University, Seoul, 04763, Republic of Korea., Shin W; Department of Semiconductor Convergence Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea., Koo RH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Im J; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Han CH; Department of Electronic Engineering, Hanyang University, Seoul, 04763, Republic of Korea., Lee JH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.; Ministry of Science and ICT, Sejong, 30121, Republic of Korea., Kwon D; Department of Electronic Engineering, Hanyang University, Seoul, 04763, Republic of Korea.
Publikováno v:
Advanced science (Weinheim, Baden-Wurttemberg, Germany) [Adv Sci (Weinh)] 2024 Oct 09, pp. e2407870. Date of Electronic Publication: 2024 Oct 09.
Autor:
Choi SH; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea., Shin J; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea.; Department of Nano Biomedical Engineering (NanoBME), Advanced Science Institute, Yonsei University, Seoul, Republic of Korea., Park C; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea., Lee JU; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea., Lee J; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea., Ambo Y; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea., Shin W; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea., Yu R; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea., Kim JY; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea.; Department of Nano Biomedical Engineering (NanoBME), Advanced Science Institute, Yonsei University, Seoul, Republic of Korea., Lah JD; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea.; Department of Nano Biomedical Engineering (NanoBME), Advanced Science Institute, Yonsei University, Seoul, Republic of Korea., Shin D; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea.; Department of Nano Biomedical Engineering (NanoBME), Advanced Science Institute, Yonsei University, Seoul, Republic of Korea., Kim G; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea.; Department of Chemistry, Yonsei University, Seoul, Republic of Korea., Noh K; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea.; Department of Nano Biomedical Engineering (NanoBME), Advanced Science Institute, Yonsei University, Seoul, Republic of Korea., Koh W; IBS School, University of Science and Technology (UST), Daejeon, Republic of Korea.; Center for Cognition and Sociality, Life Science Cluster, Institute for Basic Science (IBS), Daejeon, Republic of Korea., Lee CJ; IBS School, University of Science and Technology (UST), Daejeon, Republic of Korea.; Center for Cognition and Sociality, Life Science Cluster, Institute for Basic Science (IBS), Daejeon, Republic of Korea., Lee JH; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea. jhyun_lee@yonsei.ac.kr.; Department of Nano Biomedical Engineering (NanoBME), Advanced Science Institute, Yonsei University, Seoul, Republic of Korea. jhyun_lee@yonsei.ac.kr., Kwak M; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea. minsuk.kwak@yonsei.ac.kr.; Department of Nano Biomedical Engineering (NanoBME), Advanced Science Institute, Yonsei University, Seoul, Republic of Korea. minsuk.kwak@yonsei.ac.kr., Cheon J; Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Republic of Korea. jcheon@yonsei.ac.kr.; Department of Nano Biomedical Engineering (NanoBME), Advanced Science Institute, Yonsei University, Seoul, Republic of Korea. jcheon@yonsei.ac.kr.; Department of Chemistry, Yonsei University, Seoul, Republic of Korea. jcheon@yonsei.ac.kr.
Publikováno v:
Nature nanotechnology [Nat Nanotechnol] 2024 Sep; Vol. 19 (9), pp. 1333-1343. Date of Electronic Publication: 2024 Jul 02.
Autor:
Zhang L; State Key Laboratory of Chemical Resource Engineering, Beijing Advanced Innovation Center for Soft Matter Science and Engineering, College of Chemistry, Beijing University of Chemical Technology, Beijing, 100029, China., Wang Y; State Key Laboratory of Chemical Resource Engineering, Beijing Advanced Innovation Center for Soft Matter Science and Engineering, College of Chemistry, Beijing University of Chemical Technology, Beijing, 100029, China., Wen J; State Key Laboratory of Chemical Resource Engineering, Beijing Advanced Innovation Center for Soft Matter Science and Engineering, College of Chemistry, Beijing University of Chemical Technology, Beijing, 100029, China., Huang Y; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China.; University of Chinese Academy of Sciences, Beijing, 100049, China., Gao J; State Key Laboratory for Modification of Chemical Fibers and Polymer Materials, Center for Advanced Low-dimension Materials, College of Materials Science and Engineering, Donghua University, Shanghai, 201620, China., Duan Y; State Key Laboratory of Chemical Resource Engineering, Beijing Advanced Innovation Center for Soft Matter Science and Engineering, College of Chemistry, Beijing University of Chemical Technology, Beijing, 100029, China., Park S; Advanced Analysis Center, Korea Institute of Science and Technology, and Division of Nanoscience & Technology, KIST School, University of Science and Technology (UST), Seoul, 02792, Republic of Korea., Shin W; Department of Physics, Kangwon National University, 1 Gangwondaehak-gil, Chuncheon-si, Gangwon-do, 24341, Republic of Korea., Ma Z; State Key Laboratory for Modification of Chemical Fibers and Polymer Materials, Center for Advanced Low-dimension Materials, College of Materials Science and Engineering, Donghua University, Shanghai, 201620, China., Liu M; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China.; University of Chinese Academy of Sciences, Beijing, 100049, China., Cho SW; Department of Physics, Yonsei University, 1 Yonseidae-gil, Wonju-si, Gangwon-do, 26493, Republic of Korea., Park Y; Department of Chemistry, Institute for Molecular Science and Fusion Technology, Kangwon National University, 1 Gangwondaehak-gil, Chuncheon-si, Gangwon-do, 24341, Republic of Korea., Jung YM; Department of Chemistry, Institute for Molecular Science and Fusion Technology, Kangwon National University, 1 Gangwondaehak-gil, Chuncheon-si, Gangwon-do, 24341, Republic of Korea., Lee H; Department of Physics, Kangwon National University, 1 Gangwondaehak-gil, Chuncheon-si, Gangwon-do, 24341, Republic of Korea., Liu W; State Key Laboratory of Chemical Resource Engineering, Beijing Advanced Innovation Center for Soft Matter Science and Engineering, College of Chemistry, Beijing University of Chemical Technology, Beijing, 100029, China., Liu Y; State Key Laboratory of Chemical Resource Engineering, Beijing Advanced Innovation Center for Soft Matter Science and Engineering, College of Chemistry, Beijing University of Chemical Technology, Beijing, 100029, China.
Publikováno v:
Angewandte Chemie (International ed. in English) [Angew Chem Int Ed Engl] 2024 Nov 25; Vol. 63 (48), pp. e202408960. Date of Electronic Publication: 2024 Oct 24.
Autor:
Park MK; Department of Electrical and Computer Engineering with Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul, 08826, Republic of Korea., Hwang J; Department of Electrical and Computer Engineering with Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul, 08826, Republic of Korea., Kim S; Division of Electronic and Semiconductor Engineering, Ewha Womans University, Seoul, 03760, Republic of Korea., Shin W; Department of Electrical and Computer Engineering with Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul, 08826, Republic of Korea., Shim W; Department of Electrical and Information Engineering, Seoul National University of Science and Technology, Seoul, 01811, Republic of Korea., Bae JH; School of Electrical Engineering, Kookmin University, Seoul, 02707, Republic of Korea., Lee JH; Department of Electrical and Computer Engineering with Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul, 08826, Republic of Korea., Cho S; Division of Electronic and Semiconductor Engineering, Ewha Womans University, Seoul, 03760, Republic of Korea. felixcho@ewha.ac.kr.
Publikováno v:
Scientific reports [Sci Rep] 2024 Nov 23; Vol. 14 (1), pp. 29089. Date of Electronic Publication: 2024 Nov 23.
Autor:
Shin W; Department of Semiconductor Convergence Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea.; Department of Electrical and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Lee JY; Department of Electrical Engineering, Korea University, Seoul, 02841, Republic of Korea., Kim J; Department of Electrical and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Lee SY; Electronic Engineering Department, Gachon University, Seongnam, 13110, Republic of Korea. sylee2020@gachon.ac.kr., Lee ST; School of Electronic and Electrical Engineering, Hongik University, Seoul, 04066, Republic of Korea. lst777@hongik.ac.kr.
Publikováno v:
Discover nano [Discov Nano] 2024 Nov 21; Vol. 19 (1), pp. 187. Date of Electronic Publication: 2024 Nov 21.
Autor:
Shin W; Inter-University Semiconductor Research Center, Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, Republic of Korea.; Department of Semiconductor Convergence Engineering, Sungkyunkwan University, Suwon, Gyeonggi-do, 16419, Republic of Korea., Lee DH; Department of Semiconductor Engineering, Gachon University, Seongnam, 13120, Republic of Korea., Ko R; Department of Semiconductor Engineering, Gachon University, Seongnam, 13120, Republic of Korea., Koo RH; Inter-University Semiconductor Research Center, Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, Republic of Korea., Yoo H; Department of Semiconductor Engineering, Gachon University, Seongnam, 13120, Republic of Korea. hyoo@gachon.ac.kr.; Department of Electronic Engineering, Gachon University, Seongnam, 13120, Republic of Korea. hyoo@gachon.ac.kr., Lee ST; School of Electronic and Electrical Engineering, Hongik University, Seoul, 04066, Republic of Korea. lst777@hongik.ac.kr.
Publikováno v:
Discover nano [Discov Nano] 2024 Nov 19; Vol. 19 (1), pp. 185. Date of Electronic Publication: 2024 Nov 19.
Autor:
Kim SW; Department of Electrical Engineering, Hanyang University, Seoul, 04763, Republic of Korea., Shin W; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.; Department of Semiconductor Convergence Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea., Koo RH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Kim J; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA., Im J; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Koh D; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA., Lee JH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Cheema SS; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA., Kwon D; Department of Electrical Engineering, Hanyang University, Seoul, 04763, Republic of Korea.
Publikováno v:
Small (Weinheim an der Bergstrasse, Germany) [Small] 2024 Nov 06, pp. e2406376. Date of Electronic Publication: 2024 Nov 06.
Autor:
Koo RH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Shin W; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.; Department of Semiconductor Convergence Engineering, Sungkyunkwan University, Suwon, Gyeonggi-do, 16419, Republic of Korea., Kim J; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA., Yim J; Department of Electrical Engineering, Hanyang University, Seoul, 04763, Republic of Korea., Ko J; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Jung G; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Im J; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Park SH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Kim JJ; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea., Cheema SS; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA., Kwon D; Department of Electrical Engineering, Hanyang University, Seoul, 04763, Republic of Korea., Lee JH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.; Ministry of Science and ICT, Sejong-si, 30109, South Korea.
Publikováno v:
Advanced science (Weinheim, Baden-Wurttemberg, Germany) [Adv Sci (Weinh)] 2024 Nov; Vol. 11 (43), pp. e2407729. Date of Electronic Publication: 2024 Sep 26.