Effect of Duration of Thermal Diffusion of Boron on Silicon Structure Studied by Triple-Crystal X-ray Diffractometry.

Autor: Petrakov, A. P., Shilov, S. V., Zaınulin, G. G.

Publikováno v: Crystallography Reports. Nov2000, Vol. 45 Issue 6, p1013. 5p.

Time-Resolved Polarized FTIR-Spectroscopy on Structure and Mobility in Banana-Shaped Liquid Crystal Molecules.

Autor: Prigann, J., Shilov, S. V., Skupin, H., Kremer, F., Heppke, G., Rauch, S.

Publikováno v: Molecular Crystals & Liquid Crystals Science & Technology, Section A: Molecular Crystals & Liquid Crystals; Apr2001, Vol. 359 Issue 1, p379-386, 8p

Analysis of structural defects in boron-implanted silicon single crystals on the basis of the results of double- and triple-crystal x-ray diffractometry.

Autor: Petrakov, A. P., Tikhonov, N. A., Shilov, S. V.

Publikováno v: Technical Physics; Jun98, Vol. 43 Issue 6, p696, 5p

Segmental Mobility of Liquid Crystals and Liquid Crystalline Polymers in an Electric Field: A Study by Time-Resolved Rapid-Scan and Step-Scan FTIR Spectroscopy.

Autor: Shilov, S. V., Okretic, S., Siesler, H. W., Czarnecki, M. A.

Publikováno v: Applied Spectroscopy Reviews; Jan1996, Vol. 31 Issue 1/2, p125-165, 41p

Time-Resolved FTIR Spectroscopy on Structure and Mobility of Single Crystal Ferroelectric Liquid Crystalline Elastomers

Autor: Skupin, H., Kremer, F., Shilov, S. V., Stein, P., Finkelmann, H.

Publikováno v: Macromolecules; June 1, 1999, Vol. 32 Issue: 11 p3746-3752, 7p