Zobrazeno 1 - 10 of 60 pro vyhledávání: '"Shigeru Oho"'
3
Practical Aspects of Ultrasonic Rotary Encoder—Probe Placing, Real-Time Operation, and Automotive Bench Test
Autor: Jun Fukuda, Yoshiji Oose, Shigeru Oho, Yuto Kaneko, Masaharu Hara
Publikováno v: IEEE Transactions on Instrumentation and Measurement. 68:2335-2345
The operational principle of an ultrasonic rotary encoder was investigated in order to examine the sensitivity of the measurement to the placement of the sensor probe. Ultrasound was sent to the moving blades attached to a rotating signal plate, and
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2b9ba15df1f4673d6b69b0f913559a59
https://doi.org/10.1109/tim.2018.2874302
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5
Research Activities at Electronic Control Engineering Lab(Special issue)
Autor: Shigeru, Oho
Publikováno v: 日本工業大学研究報告 = Report of researches, Nippon Institute of Technology. 46(3):29-32
Researches at the Electoronic Control Engineering Lab emcompass from sensing to control and simulation on automotive electronic systems. Uttrasonic se nsors for measurering engine rotation and vehicle turning are reported. C omputer simulations on en
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=jairo_______::aaafc84e57fe91ad470ce9075f6c2632
https://mlib3.nit.ac.jp/webopac/TC00538861
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6
Virtualization: System-Level Fault Simulation of SRAM Errors in Automotive Electronic Control Systems
Autor: Yohei Nakata, Hiroshi Kawaguchi, Shigeru Oho, Masahiko Yoshimoto, Yasuo Sugure, Yasuhiro Ito
Publikováno v: VLSI Design and Test for Systems Dependability ISBN: 9784431565925
In the coming age of self-driving cars, system-level testing of electronic control will become much more important to ensure dependable operation of automated functions. Modern VLSI devices are not always totally reliable. They can fail due to aging,
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9cb54df84f907f7c3fea44ecebd3c5b9
https://doi.org/10.1007/978-4-431-56594-9_15
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7
A Low-Latency DMR Architecture with Fast Checkpoint Recovery Scheme Using Simultaneously Copyable SRAM
Autor: Go Matsukawa, Yohei Nakata, Masahiko Yoshimoto, Hiroshi Kawaguchi, Yasuo Sugure, Shigeru Oho
Publikováno v: VLSI Design and Test for Systems Dependability ISBN: 9784431565925
This chapter presents a novel architecture for a fault-tolerant and dual modular redundancy (DMR) system using a checkpoint recovery approach. The architecture features exploitation of SRAM with simultaneous copy and instantaneous compare function. I
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::35e86c82e34666e368bcfb7da2d6c810
https://doi.org/10.1007/978-4-431-56594-9_25
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8
An ultrasonic rotary encoder and its application to torque estimation
Autor: Masaharu Hara, Yuto Kaneko, Shigeru Oho
Publikováno v: SAS
In this paper, the ultrasonic sensing of rotation angle, speed, and torque is proposed and successfully demonstrated. To generate a rotary encoder, an ultrasonic wave was sent to and reflected by the blades attached to a revolving shaft. The ultrason
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9b51f2d6c48f89aaeb3af6bfcdb57315
https://doi.org/10.1109/sas.2018.8336759
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10
Freshman camp activity report of the department of electrical and electronics engineering(Educationai Development Symposiums)
Autor: Minoru, Aoyagi, Akito, Takahashi, Yutaka, Ishikawa, Shigeru, Oho, Mamoru, Ugajin, Hideaki, Yoshino, Kiyoshi, Yoshida, Kenya, Jinno, Takahiro, Ueno, Takefumi, Hirakuri, Nobuyasu, Takemura, Masanori, Kimoto, Takayuki, Kimura, Hiroyuki, Shimizu, Kenkou, Ohta, Yasutoshi, Takemoto, Takuya, Shindo, Mika, Asami
Publikováno v: 日本工業大学研究報告 = Report of researches, Nippon Institute of Technology. 46(2):32-34
Every April, right before our academic year starts, we invite our new students to participate in the freshman camp Because the transition into college can be difficult for many students, the freshman camp is intended to ease the transition into colle
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=jairo_______::eb894dc940949b7629e0ce33097cc091
https://mlib3.nit.ac.jp/webopac/TC00537725
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