Zobrazeno 1 - 9 of 9 pro vyhledávání: '"Shigemasa Ohta"'
1
Dynamics of Rh nanoparticle surface structure during NO reduction revealed by operando transmission electron microscopy
Autor: Hiromochi Tanaka, Shunsuke Muto, Tetsuo Higuchi, Koji Orita, Atsushi Maede, Shigemasa Ohta, Shigeo Arai, Masahide Miura, Hiroyuki Ishikawa
Publikováno v: Applied Catalysis A: General. 626:118334
Elucidating the NOx purification mechanism of exhaust gas catalysts such as Rh nanoparticles is essential for the development of air purification technology required for environmentally conscious automobiles. In this study, operando observations of R
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e7876db59f1146147d2230dd701bb8a2
https://doi.org/10.1016/j.apcata.2021.118334
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2
Environmental high-voltage S/TEM combined with a quadrupole mass spectrometer for concurrent in situ structural characterization and detection of product gas molecules associated with chemical reactions
Autor: Shigemasa Ohta, Shigeo Arai, Masaya Ibe, Tetsuo Higuchi, Koji Orita, Takuya Suganuma, Shunsuke Muto, Hirohito Hirata, Hiromochi Tanaka
Publikováno v: Microscopy (Oxford, England). 68(2)
We introduce herein a combined environmental high-voltage electron microscope and a quadrupole mass spectrometer to detect product gas species associated with chemical reactions occurring in the microscope, which allows new operando experiments of, f
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8b5f94a62664de7d40e5a88da5960e60
https://pubmed.ncbi.nlm.nih.gov/30576560
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4
Analysis of nonlinear intensity attenuation in bright-field TEM images for correct 3D reconstruction of the density in micron-sized materials
Autor: Katsuhiro Sasaki, Syuichi Yuasa, Jun Yamasaki, Shigemasa Ohta, Michihiro Mutoh, Shigeo Arai, Nobuo Tanaka
Publikováno v: Microscopy (Oxford, England). 63(5)
To obtain the correct tomographic reconstruction of micron-sized materials, the nonlinear intensity attenuation of bright-field transmission electron microscopy (BF-TEM) images was analyzed as a function of the sample thickness using a high-voltage e
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66a3e1b6d6e89e22845e896bc09822f6
https://pubmed.ncbi.nlm.nih.gov/24891385
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