Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Shigemasa Nakasugi"'
Publikováno v:
IEEJ Transactions on Fundamentals and Materials. 142:152-158
Publikováno v:
Materials Advances. 2:7017-7023
We present the dielectric relaxation properties of the ferroelectric smectic-A (SmAPF) phase formed by a mixture of bent-shaped dimeric molecules α,ω-bis(4-alkoxyanilinebenzylidene-4′-carbonyloxy)pentanes with different alkyl chain lengths. The S
Publikováno v:
SPIE Proceedings.
Spin-on-carbon hard mask (SOC HM) has been used in semiconductor manufacturing since 45nm node as an alternative carbon hard mask process to chemical vapor deposition (CVD). As advancement of semiconductor to 2X nm nodes and beyond, multiple patterni
Publikováno v:
High Performance Polymers. 18(5):761-775
The sub-micrometer and micrometer-scale self-assembled structures of a series of amphiphilic dendrons constructed from the building blocks of aromatic amide, triethylene glycol, and octadecyl groups were evaluated. The dendrons from the first to the
Autor:
Munirathna Padmanaban, Joonyeon Cho, Huirong Yao, Hiroshi Yanagita, Takanori Kudo, Yi Cao, Shigemasa Nakasugi, YoungJun Her, Fumihiro Suzuki, Georg Pawlowski, Misumi Motoki, Jin Li, Ide Yasuaki
Publikováno v:
SPIE Proceedings.
Shot noise is a significant issue in EUV lithography, especially in printing small area features like contact holes. This brings about LCDU (Local CD Uniformity) issue and LCDU-sensitivity tradeoff. This paper describes efforts to alleviate this issu