Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Shigeki Maekawa"'
Autor:
Miyamoto Makoto, Junji Hirotsuji, Tadashi Saitoh, Shigeki Maekawa, Satoshi Ueyama, Nobuhide Hinomoto
Publikováno v:
Japanese Journal of Applied Physics. 46:1236-1243
It is increasingly required to reduce the environmental impact and cost in the field of industrial cleaning. As a substitute for conventional degreasing technology using organic solvents, acids, and alkalis, the authors have developed a new cleaning
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::56e7c28e9fa97a49851b2ddae56aa1f8
https://doi.org/10.1143/jjap.46.1236
https://doi.org/10.1143/jjap.46.1236
Autor:
Shigeki Maekawa, K. Miki, Mogumi Chiyoda-ku Takemoto, Y. Deguchi, Yoshihiro Kashiba, T. Nagata
Publikováno v:
2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070).
A probe card with tungsten probes (needles) is conventionally used for wafer testing. However, the electrical contact between a probe and an aluminum bonding pad becomes unstable, due to the adhesive pick-up of aluminum on the probe tip. In order to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92b9e5a55eb6e4b329f79e1d88073370
https://doi.org/10.1109/ectc.2000.853317
https://doi.org/10.1109/ectc.2000.853317