Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Shickova, Adelina"'
Autor:
Shickova, Adelina
Contents Chapter I: Introduction 23 I.1. CMOS Device Scaling 23 I.2. Objectives of the thesis 29 I.3. Structure of the thesis 30 Chapter II: State-of-the-Art Experimental Techniques 30 Chapter III: Reliability of Devices with Fully Silicided Gate Sta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1131::d4116272288e95e50baf5fb006d9b896
https://lirias.kuleuven.be/handle/1979/2591
https://lirias.kuleuven.be/handle/1979/2591
Autor:
Hoentschel, Jan, Ong, Shiang Yang, Balzer, Torben, Sassiat, Nicolas, Yan, Ran, Herrmann, Tom, Flachowsky, Stefan, Grass, Carsten, Beyer, Sven, Kallensee, Oliver, Lin, Yu-Yin, Shickova, Adelina, Muehlhoff, Armin, Kretzschmar, Claudia, Winkler, Joerg, Wiatr, Maciej, Horstmann, Manfred
Publikováno v:
2013 14th International Conference on Ultimate Integration on Silicon (ULIS); 2013, p37-40, 4p
Autor:
Shickova, Adelina1,2 adelina.shickova@imec.be, Verheyen, Peter1, Eneman, Geert1,2,3, Degraeve, Robin1, Simoen, Eddy1, Favia, Paola1, Klenov, Dmitri O.4, Andrés, Enrique San, Kaczer, Ben1, Jurczak, Malgorzata1, Absil, Philippe1, Maes, Herman E.1,2, Groeseneken, Guido1,2
Publikováno v:
IEEE Transactions on Electron Devices. Dec2008, Vol. 55 Issue 12, p3432-3441. 10p.
Autor:
Shickova, Adelina K., Verheyen, Peter, Eneman, Geert, San, Enrique, Absil, Philip, Kaczer, Ben, Groeseneken, Guido
Publikováno v:
ECS Transactions; October 2006, Vol. 3 Issue: 2 p253-261, 9p