Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Shiano Ono"'
Autor:
Kuniyuki Kakushima, Ryuji Yokokawa, Yusuke Taii, Hiroshi Toshiyoshi, Keiji Isamoto, Hiroyuki Fujita, Shiano Ono, Changho Chong, Takuji Takahashi
Publikováno v:
IEEJ Transactions on Sensors and Micromachines. 127:221-227
We propose a surface treatment technique to effectively avoid both process stiction and in-use stiction of silicon MEMS (microelectromechanical system) devices by using all-vapor processes: vapor HF (hydrofluoric) acid for sacrificial release, UV ozo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::184552a567cdc4a927a5da2640303c69
https://doi.org/10.1541/ieejsmas.127.221
https://doi.org/10.1541/ieejsmas.127.221
Autor:
Shiano Ono, Takuji Takahashi
Publikováno v:
Ultramicroscopy. 105:42-50
We have proposed and demonstrated a novel method for fast imaging in intermittent contact mode atomic force microscopy (AFM) using a sample-and-hold circuit for direct monitoring of cantilever deflection signals. This method enables us to construct a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b316ad612a813244c1037faccc29dc0
https://doi.org/10.1016/j.ultramic.2005.06.016
https://doi.org/10.1016/j.ultramic.2005.06.016
Autor:
Shiano Ono, Takuji Takahashi
Publikováno v:
Ultramicroscopy. 100:287-292
In most scanning probe methods like an atomic force microscopy, a cantilever is mechanically vibrated in order to obtain topographies. Therefore, a tip-to-sample distance periodically changes during the scanning. Since the electrostatic force, which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6a6ebaa0f58ed66f135385b8f7ee9dee
https://doi.org/10.1016/j.ultramic.2004.01.017
https://doi.org/10.1016/j.ultramic.2004.01.017
Publikováno v:
Japanese Journal of Applied Physics. 42:4869-4873
We fabricated InAs thin films, wires and self-assembled quantum dots (QDs) on GaAs substrates, and studied their surface potentials by Kelvin probe force microscopy (KFM). The obtained potential images on InAs wires became less distinct as the tip-to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d214ec15ae3a7b2b30314d9ae608211b
https://doi.org/10.1143/jjap.42.4869
https://doi.org/10.1143/jjap.42.4869
Autor:
Yuzuru Ohji, Kazuto Ikeda, Mitsuo Ogasawara, Hiroyuki Shinada, Akira Katakami, Shiano Ono, Masanari Koguchi, Hiroshi Kakibayashi, Miyuki Yamane, Jiro Yugami
Publikováno v:
SPIE Proceedings.
We have improved both the spatial resolution and precision of three-dimensional (3D) electron microscopy, which is based on conventional scanning transmission electron microscopy (STEM), by using a micro-pillar specimen together with a 3D analysis ho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00ec61a44c0b5dcef48c3dba8e3cce7c
https://doi.org/10.1117/12.878949
https://doi.org/10.1117/12.878949
Autor:
Ken Harada, Ikeda Masaki, Akira Sugawara, Ruriko Tsuneta, Shiano Ono, Masanari Koguchi, Miyuki Yamane
Publikováno v:
Microscopy and Microanalysis. 20:268-269
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e515266af4b7cb44d67bac330f4de7a1
https://doi.org/10.1017/s1431927614003067
https://doi.org/10.1017/s1431927614003067
Publikováno v:
Ultramicroscopy. 109(8)
We have proposed an intermittent bias application method as well as a sampling detection method of cantilever deflection in Kelvin probe force microscopy (KFM) to improve its performances for surface potential measurements. In the former method, spik
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::32c59647dcb94e347c39df67adf061d7
https://pubmed.ncbi.nlm.nih.gov/19345495
https://pubmed.ncbi.nlm.nih.gov/19345495
Publikováno v:
Ultramicroscopy. 91(1-4)
We fabricated InAs nanowires on GaAs giant step structures, and studied their surfaces by two methods; one was current detection by contact-mode atomic force microscopy, and the other was surface potential measurement by Kelvin probe force microscopy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7743384e995d20e62751a85000c5ff8c
https://pubmed.ncbi.nlm.nih.gov/12211460
https://pubmed.ncbi.nlm.nih.gov/12211460
Publikováno v:
Extended Abstracts of the 2000 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3cfcc184ff81683b474f01d68414b359
https://doi.org/10.7567/ssdm.2000.d-5-5
https://doi.org/10.7567/ssdm.2000.d-5-5
Autor:
Miyuki Yamane, Y Ohji, Masanari Koguchi, Hiroshi Kakibayashi, A Katakami, M Miyakawa, Shiano Ono, J Yugami, Mitsuo Ogasawara
Publikováno v:
Microscopy and Microanalysis. 15:634-635
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74481fd90aa1f01c6496aff73202708c
https://doi.org/10.1017/s1431927609092976
https://doi.org/10.1017/s1431927609092976