Zobrazeno 1 - 10
of 268
pro vyhledávání: '"Shi-Jie Wen"'
Chow, Shun Man Emily.
Thesis (M.Phil.)--Chinese University of Hong Kong, 2013.
Includes bibliographical references.
Electronic reproduction. Hong Kong : Chinese University of Hong Kong, [2012] System requirements: Adobe Acrobat Reader.
Thesis (M.Phil.)--Chinese University of Hong Kong, 2013.
Includes bibliographical references.
Electronic reproduction. Hong Kong : Chinese University of Hong Kong, [2012] System requirements: Adobe Acrobat Reader.
Externí odkaz:
http://library.cuhk.edu.hk/record=b5884320
http://repository.lib.cuhk.edu.hk/en/item/cuhk-327812
http://repository.lib.cuhk.edu.hk/en/item/cuhk-327812
Publikováno v:
IEEE Access, Vol 9, Pp 137514-137523 (2021)
The methodological approach of hammering multiple rows is newly proposed to evaluate today’s SDRAMs, employed with in-DRAM mitigation circuits. The multiple rows are selected based on the one-row hammering test (single row hammering without refresh
Externí odkaz:
https://doaj.org/article/c4e20534140d4565af4a40dd9d059d34
Publikováno v:
Materials, Vol 15, Iss 21, p 7849 (2022)
This study focuses on the effect of the substrate temperature (TS) on the quality of VO2 thin films prepared by DC magnetron sputtering. TS was varied from 350 to 600 °C and the effects on the surface morphology, microstructure, optical and electric
Externí odkaz:
https://doaj.org/article/9d4d5a8069ed4befb2594070d8412460
Autor:
Han Jia, Xin Wei, Qiu-Xia Wang, Yuan-Bo Wang, Shi-Jie Wen, Fang-Ning Fan, Qiang Wang, Zhe Wang, De-Xin Liu, Pan Huang
Publikováno v:
Petroleum Science. 20:1217-1224
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::89de96a2ed144716fc21a60f19bfc0d6
https://doi.org/10.1016/j.petsci.2022.08.032
https://doi.org/10.1016/j.petsci.2022.08.032
Autor:
Zongru Li, Christopher Elash, Chen Jin, Li Chen, Shi-Jie Wen, Rita Fung, Jiesi Xing, Shuting Shi, Zhi Wu Yang, Bharat L. Bhuva
Publikováno v:
IEEE Transactions on Nuclear Science. 70:596-602
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2478c885b3bda684a94f3e4db0fcffe
https://doi.org/10.1109/tns.2023.3257744
https://doi.org/10.1109/tns.2023.3257744
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 22:194-204
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ece669c7066056bbd55dadd8ca4512f
https://doi.org/10.1109/tdmr.2022.3156807
https://doi.org/10.1109/tdmr.2022.3156807
Autor:
Hai-Fen LI, Hao WEI, Shi-Jie WEN, Qing LU, Hao LIU, Shao-Xiong LI, Yan-Bin HONG, Xiao-Ping CHEN, Xuan-Qiang LIANG
Publikováno v:
Acta Agronomica Sinica. 48:1558-1565
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f4cc1e19ec25145efce472a2cdaf70d
https://doi.org/10.3724/sp.j.1006.2022.14093
https://doi.org/10.3724/sp.j.1006.2022.14093
Autor:
Hyeongseok Oh, Myungsun Chun, Jiwon Lee, Shi-Jie Wen, Nick Yu, Byung-Gun Park, Sanghyeon Baeg
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea3102dcbe1cca204502d6fa5306a32b
https://doi.org/10.1109/irps48203.2023.10117935
https://doi.org/10.1109/irps48203.2023.10117935
Publikováno v:
IEEE Transactions on Nuclear Science. 69:558-566
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01332f5848ddee347145eb2f99e4fa28
https://doi.org/10.1109/tns.2022.3149487
https://doi.org/10.1109/tns.2022.3149487
Autor:
Chunzi Zhang, Ozan Gunes, Yuanshi Li, Xiaoyu Cui, Masoud Mohammadtaheri, Shi-Jie Wen, Rick Wong, Qiaoqin Yang, Safa Kasap
Publikováno v:
Materials, Vol 13, Iss 22, p 5132 (2020)
The authors would like to correct a typographical error in their paper [...]
Externí odkaz:
https://doaj.org/article/df656ce96e18434eb59f8e52e614dc0d