Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Shi Yeon Kim"'
Publikováno v:
Journal of the Korean Ceramic Society. 59:638-646
Publikováno v:
Journal of Korean Powder Metallurgy Institute. 27:498-502
Publikováno v:
Journal of the European Ceramic Society. 40:5349-5356
The AlN substrate was fabricated by the tape casting process, and its thermal conductivity and electrical conductivity were investigated for various ball milling times and types of milling media. The oxygen content was measured after ball milling, de
Effect of Li2O-Bi2O3 Addition on the Piezoelectric Properties of Pb(Mg1/3Nb2/3)0.65Ti0.35O3 Ceramics
Publikováno v:
Journal of Korean Powder Metallurgy Institute. 26:405-409
Publikováno v:
Ceramics International. 45:17930-17935
We fabricated the AlN substrate using tape casting method and investigated the effect of carbon content on sinterability and thermal conductivity. The carbon residue content was measured after the debinding of the AlN green sheet containing 1 wt% Ca
Publikováno v:
Journal of Nanoscience and Nanotechnology. 19:1580-1584
Cordierite is an alumina-magnesia-silica compound widely used as a thermal shock resistant material due to its high thermal shock resistance, low coefficient of thermal expansion (CTE), low dielectric constant, and good electrical insulation. However
Publikováno v:
Korean Journal of Materials Research. 28:719-724
Autor:
Kwang-Woong Lee, Ji-Hyun Lee, Sung Wook Shin, Sung Joo Kim, Jae Won Joh, Doo-Hoon Lee, Jong-Won Kim, Hwa-Young Park, Soo-Youn Lee, Hwan Hyo Lee, Jin Wan Park, Shi-Yeon Kim, Hee-Hoon Yoon, Doo-Hee Jung, Yon Ho Choe, Suk-Koo Lee
Publikováno v:
Cell Transplantation, Vol 16 (2007)
Glycogen storage disease type I (GSD-I) is a group of autosomal recessive disorders with an incidence of 1 in 100,000. The two major subtypes are GSD-Ia, caused by a deficiency of glucose-6-phosphatase (G6Pase), and GSD-Ib, caused by a deficiency of
Externí odkaz:
https://doaj.org/article/b2351959353842dbb78d4cfdc4d90eb7
Publikováno v:
Journal of Nanoscience and Nanotechnology. 17:3528-3532
Publikováno v:
Journal of the Korean Institute of Electrical and Electronic Material Engineers. 29:781-785