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Autor:
Jim C. Cheng, Wei-Cheng Lien, Ayden Maralani, Shi Qian Shao, Kristen L. Dorsey, Albert P. Pisano
Publikováno v:
Materials Science Forum. :636-639
In this work, we demonstrate the stable operation of 4H-silicon carbide (SiC) p-n diodes at temperature up to 600 °C. In-depth study methods of simulation, fabrication and characterization of the 4H-SiC p-n diode are developed. The simulation result