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Publikováno v:
2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC).
For the first time, this paper reveals and explains the details how to comprehend and deduce the evolution of current filaments in FRD by the negative resistance phenomenon presented in reverse recovery I-V curve. Further study on simulation data sho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5626d2c9465466ca14a87979b9a92c9d
https://doi.org/10.1109/edssc.2019.8754391
https://doi.org/10.1109/edssc.2019.8754391
