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High-Discrimination Circular Polarization Detection Based on Dielectric-Metal-Hybrid Chiral Metamirror Integrated Quantum Well Infrared Photodetectors.

Autor: Shen, Jinyong^1,2,3,4 (AUTHOR), Zhu, Tianyun^1,3 (AUTHOR), Zhou, Jing^1,3 (AUTHOR) jzhou@mail.sitp.ac.cn, Chu, Zeshi^1,3 (AUTHOR), Ren, Xiansong¹ (AUTHOR), Deng, Jie^1,3 (AUTHOR), Dai, Xu^1,3 (AUTHOR), Li, Fangzhe¹ (AUTHOR), Wang, Bo¹ (AUTHOR), Chen, Xiaoshuang^1,2,3 (AUTHOR) jzhou@mail.sitp.ac.cn, Lu, Wei^1,2,3 (AUTHOR) jzhou@mail.sitp.ac.cn

Publikováno v: Sensors (14248220). Jan2023, Vol. 23 Issue 1, p168. 12p.

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High-Discrimination Circular Polarization Detection Based on Dielectric-Metal-Hybrid Chiral Metamirror Integrated Quantum Well Infrared Photodetectors.

Autor: Shen J; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.; Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, China.; University of Chinese Academy of Sciences, Beijing 100049, China.; Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China., Zhu T; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.; University of Chinese Academy of Sciences, Beijing 100049, China., Zhou J; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.; University of Chinese Academy of Sciences, Beijing 100049, China., Chu Z; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.; University of Chinese Academy of Sciences, Beijing 100049, China., Ren X; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China., Deng J; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.; University of Chinese Academy of Sciences, Beijing 100049, China., Dai X; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.; University of Chinese Academy of Sciences, Beijing 100049, China., Li F; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China., Wang B; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China., Chen X; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.; Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, China.; University of Chinese Academy of Sciences, Beijing 100049, China., Lu W; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.; Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, China.; University of Chinese Academy of Sciences, Beijing 100049, China.

Publikováno v: Sensors (Basel, Switzerland) [Sensors (Basel)] 2022 Dec 24; Vol. 23 (1). Date of Electronic Publication: 2022 Dec 24.