Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Sheinfux HH"'
Autor:
Woo SY; Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405 Orsay, France., Shao F; Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405 Orsay, France.; State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.; College of Materials Science and Optoelectronic Technology, University of Chinese Academy of Sciences, Beijing 100083, China., Arora A; Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany.; Indian Institute of Science Education and Research, Dr. Homi Bhabha Road, 411008 Pune, India., Schneider R; Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany., Wu N; Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405 Orsay, France.; Université Paris-Saclay, CNRS, Institut des Sciences Moléculaires d'Orsay, 91405 Orsay, France., Mayne AJ; Université Paris-Saclay, CNRS, Institut des Sciences Moléculaires d'Orsay, 91405 Orsay, France., Ho CH; Graduate Institute of Applied Science and Technology, National Taiwan University of Science and Technology, Taipei 106, Taiwan., Och M; Department of Materials, Imperial College London, London SW7 2AZ, U.K., Mattevi C; Department of Materials, Imperial College London, London SW7 2AZ, U.K., Reserbat-Plantey A; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels, Spain.; Université Côte d'Azur, CNRS, CRHEA, 06560 Valbonne, Sophia-Antipolis, France., Moreno Á; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels, Spain., Sheinfux HH; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels, Spain.; Department of Physics, Bar-Ilan University, Ramat Gan 5290002, Israel., Watanabe K; Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan., Taniguchi T; Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan., Michaelis de Vasconcellos S; Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany., Koppens FHL; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels, Spain.; ICREA-Institució Catalana de Recerca i Estudis Avançats, Passeig Lluís Companys 23, 08010 Barcelona, Spain., Niu Z; State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.; College of Materials Science and Optoelectronic Technology, University of Chinese Academy of Sciences, Beijing 100083, China., Stéphan O; Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405 Orsay, France., Kociak M; Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405 Orsay, France., García de Abajo FJ; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels, Spain.; ICREA-Institució Catalana de Recerca i Estudis Avançats, Passeig Lluís Companys 23, 08010 Barcelona, Spain., Bratschitsch R; Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany., Konečná A; Central European Institute of Technology, Brno University of Technology, Brno 612 00, Czech Republic.; Institute of Physical Engineering, Brno University of Technology, Brno 616 69, Czech Republic., Tizei LHG; Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405 Orsay, France.
Publikováno v:
Nano letters [Nano Lett] 2024 Mar 27; Vol. 24 (12), pp. 3678-3685. Date of Electronic Publication: 2024 Mar 12.
Autor:
Dikopoltsev A; Physics Department, Technion, 32000 Haifa, Israel., Weidemann S; Institute for Physics, University of Rostock, 18059 Rostock, Germany., Kremer M; Institute for Physics, University of Rostock, 18059 Rostock, Germany., Steinfurth A; Institute for Physics, University of Rostock, 18059 Rostock, Germany., Sheinfux HH; Physics Department, Technion, 32000 Haifa, Israel.; ICFO-Institute of Photonic Sciences, Mediterranean Technology Park, 08860 Castelldefels, Barcelona, Spain., Szameit A; Institute for Physics, University of Rostock, 18059 Rostock, Germany., Segev M; Physics Department, Technion, 32000 Haifa, Israel.; Electrical Engineering Department, Technion, 32000 Haifa, Israel.
Publikováno v:
Science advances [Sci Adv] 2022 May 27; Vol. 8 (21), pp. eabn7769. Date of Electronic Publication: 2022 May 25.
Autor:
Kurman Y; Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, 32000 Haifa, Israel., Dahan R; Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, 32000 Haifa, Israel., Sheinfux HH; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, Av. Carl Friedrich Gauss 3, 08860 Castelldefels (Barcelona), Spain., Wang K; Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, 32000 Haifa, Israel., Yannai M; Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, 32000 Haifa, Israel., Adiv Y; Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, 32000 Haifa, Israel., Reinhardt O; Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, 32000 Haifa, Israel., Tizei LHG; Laboratoire de Physique des Solides, Université Paris-Saclay, CNRS, 91405 Orsay, France., Woo SY; Laboratoire de Physique des Solides, Université Paris-Saclay, CNRS, 91405 Orsay, France., Li J; Tim Taylor Department of Chemical Engineering, Kansas State University, Manhattan, KS 66506, USA., Edgar JH; Tim Taylor Department of Chemical Engineering, Kansas State University, Manhattan, KS 66506, USA., Kociak M; Laboratoire de Physique des Solides, Université Paris-Saclay, CNRS, 91405 Orsay, France., Koppens FHL; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, Av. Carl Friedrich Gauss 3, 08860 Castelldefels (Barcelona), Spain. kaminer@technion.ac.il frank.koppens@icfo.eu.; ICREA-Institució Catalana de Recerca i Estudis Avanats, Passeig Lluís Companys 23, 08010 Barcelona, Spain., Kaminer I; Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, 32000 Haifa, Israel. kaminer@technion.ac.il frank.koppens@icfo.eu.
Publikováno v:
Science (New York, N.Y.) [Science] 2021 Jun 11; Vol. 372 (6547), pp. 1181-1186.
Publikováno v:
Nature communications [Nat Commun] 2018 Feb 08; Vol. 9, pp. 16181. Date of Electronic Publication: 2018 Feb 08.
Autor:
Sheinfux HH; Technion, Israel Institute of Technology, Haifa 32000, Israel., Lumer Y; Technion, Israel Institute of Technology, Haifa 32000, Israel., Ankonina G; Technion, Israel Institute of Technology, Haifa 32000, Israel., Genack AZ; Physics Department, Queens College and Graduate Center of the City University of New York (CUNY), Flushing, NY 11367, USA., Bartal G; Technion, Israel Institute of Technology, Haifa 32000, Israel., Segev M; Technion, Israel Institute of Technology, Haifa 32000, Israel. msegev@tx.technion.ac.il.
Publikováno v:
Science (New York, N.Y.) [Science] 2017 Jun 02; Vol. 356 (6341), pp. 953-956.