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pro vyhledávání: '"Sheetal Tak"'
Autor:
Sheetal Tak-Barekar, Madan Mali
Publikováno v:
Journal of University of Shanghai for Science and Technology. 23:667-677
The efforts in the semiconductor industry lead to the up-gradation of device size and performance of the devices. Extensive use of cache memory with significant size has become the requirement of most devices, applications, and gadgets. Advanced nano
Molecular Characterization of Green Gram [Vigna radiata (L.) Wilczek] for Future Breeding Programmes
Publikováno v:
International Journal of Current Microbiology and Applied Sciences. 6:1385-1398
Publikováno v:
International Journal of Current Microbiology and Applied Sciences. 6:942-949
Publikováno v:
International Journal of Current Microbiology and Applied Sciences. 6:1150-1158
Autor:
Sheetal Tak, Madan Mali
Publikováno v:
2015 International Conference on Pervasive Computing (ICPC).
Detection and corrective measures of faults in Static Random Access Memory (SRAM) is always been thrust area of research. These faults occur due to physical failure, device parameter variations and process variations. For smooth operation of the circ