Novel Deposition Method of Crosslinked Polyethylene Thin Film for Low-Refractive-Index Mid-Infrared Optical Coatings.

Autor: Jeon T; Applied Physics and Materials Science, California Institute of Technology, 1200 East California Boulevard, MC 200-79, Pasadena, CA 91125, USA., Myung J; Applied Physics and Materials Science, California Institute of Technology, 1200 East California Boulevard, MC 200-79, Pasadena, CA 91125, USA., Choi C; Applied Physics and Materials Science, California Institute of Technology, 1200 East California Boulevard, MC 200-79, Pasadena, CA 91125, USA., Shayegan K; Applied Physics and Materials Science, California Institute of Technology, 1200 East California Boulevard, MC 200-79, Pasadena, CA 91125, USA., Lewis SM; Applied Physics and Materials Science, California Institute of Technology, 1200 East California Boulevard, MC 200-79, Pasadena, CA 91125, USA., Scherer A; Applied Physics and Materials Science, California Institute of Technology, 1200 East California Boulevard, MC 200-79, Pasadena, CA 91125, USA.

Publikováno v: Sensors (Basel, Switzerland) [Sensors (Basel)] 2023 Dec 14; Vol. 23 (24). Date of Electronic Publication: 2023 Dec 14.

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Actively tunable nonreciprocal thermal emitter with SiC grating and anisotropy InAs film.

Autor: Tang, Qiaoqi, Fan, Chunzhen

Publikováno v: Europhysics Letters; May2023, Vol. 142 Issue 3, p1-7, 7p

Broadband mid-infrared non-reciprocal absorption using magnetized gradient epsilon-near-zero thin films.

Autor: Liu M; Institute of Engineering Thermophysics, MOE Key Laboratory for Power Machinery and Engineering, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China.; Department of Electrical and Computer Engineering, National University of Singapore, Singapore, Singapore., Xia S; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, China.; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China., Wan W; Key Laboratory of Terahertz Solid State Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China., Qin J; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, China.; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China., Li H; Key Laboratory of Terahertz Solid State Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China. hua.li@mail.sim.ac.cn.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Science, Beijing, China. hua.li@mail.sim.ac.cn., Zhao C; Institute of Engineering Thermophysics, MOE Key Laboratory for Power Machinery and Engineering, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China. changying.zhao@sjtu.edu.cn., Bi L; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, China. bilei@uestc.edu.cn.; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China. bilei@uestc.edu.cn., Qiu CW; Department of Electrical and Computer Engineering, National University of Singapore, Singapore, Singapore. chengwei.qiu@nus.edu.sg.

Publikováno v: Nature materials [Nat Mater] 2023 Oct; Vol. 22 (10), pp. 1196-1202. Date of Electronic Publication: 2023 Aug 17.