Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Sharon Shwartz"'
Autor:
Sharon Shwartz
Publikováno v:
Quantum Sensing, Imaging, and Precision Metrology.
Autor:
Haim Aknin, Sharon Shwartz
Publikováno v:
Optical and Quantum Sensing and Precision Metrology II.
Autor:
Yishai Klein, Alok K. Tripathi, Edward Strizhevsky, Flavio Capotondi, Dario De Angelis, Luca Giannessi, Matteo Pancaldi, Emanuele Pedersoli, Kevin C. Prince, Or Sefi, Young Yong Kim, Ivan A. Vartanyants, Sharon Shwartz
We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet absorption spectroscopy at free-electron laser sources. Our approach requires an on-line spectrometer before the sample and a downstream
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5534fe0ff4bd26861db904e6376f9dda
http://arxiv.org/abs/2203.00688
http://arxiv.org/abs/2203.00688
Autor:
Sharon Shwartz
Publikováno v:
Science Bulletin. 66:857-859
Autor:
Uwe Wiedmann, Loucas Tsakalakos, Eliahu Cohen, Vasil Bogdan Neculaes, Sharon Shwartz, Brian David Yanoff, Jonathan R. Owens
Publikováno v:
Optical and Quantum Sensing and Precision Metrology.
We provide an introductory overview of medical and industrial x-ray imaging applications and requirements for readers whose primary background is in quantum imaging. We discuss some opportunities for quantum X-ray imaging and related techniques such
Publikováno v:
Conference on Lasers and Electro-Optics.
We demonstrate efficient interaction of hard x-ray single photons with a beam splitter for the first time and use it to show the nonclassical behavior of x-ray heralded photons.
Publikováno v:
Conference on Lasers and Electro-Optics.
We report a proof of principle experiment demonstrating the use of structured illumination and coincidence for x-ray fluorescence imaging at very high spatial resolution and short measurement time with a conventional x-ray tube.
Autor:
Sharon Shwartz, Sergey Volkovich
Publikováno v:
Optics letters. 45(10)
We show that subattosecond delays and subangstrom optical path differences can be measured by using Hong–Ou–Mandel interference measurements with x-rays. Our scheme relies on the subattosecond correlation time of photon pairs that are generated b
Autor:
Sharon Shwartz
Publikováno v:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II.
We present measurements of the polarization dependencies of the x-ray signal photons generated by the effect of parametric down-conversion of x rays into ultraviolet radiation. The results exhibit pronounced discrepancies with the classical model for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b99afb4b6045c6ec8a0c781739b1cd4b