Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Sharadha Sambasivan"'
Publikováno v:
EDULEARN Proceedings.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48a8b0d4270eda264eeda437c12ce957
https://doi.org/10.21125/edulearn.2019.1449
https://doi.org/10.21125/edulearn.2019.1449
Autor:
Won-Sub Yoon, James A. Misewich, Tae-Jin Park, Stanislaus S. Wong, Daniel A. Fischer, Sharadha Sambasivan
Publikováno v:
The Journal of Physical Chemistry C. 112:10359-10369
We present a systematic and detailed near edge X-ray absorption fine structure (NEXAFS) experimental investigation of the electronic structure and chemistry of iron-based metal oxide nanostructured (FeMONS) materials including BiFeO3, Bi2Fe4O9, α-Fe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04655f8622388229a9dc3ea528465205
https://doi.org/10.1021/jp801449p
https://doi.org/10.1021/jp801449p
Autor:
Joseph L. Lenhart, Douglas J. Guerrero, Rama Puligadda, Wen-Li Wu, Sharadha Sambasivan, Daniel A. Fischer, Eric K. Lin, Yubao Wang
Publikováno v:
Applied Surface Science. 253:4166-4175
Interactions between a bottom anti-reflective coating (BARC) and a photoresist can critically impact lithographic patterns. For example, a lithographic pattern can shrink or spread near a BARC interface, a process called undercutting or footing respe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a77010898abab14ec41fb880fb351f11
https://doi.org/10.1016/j.apsusc.2006.09.022
https://doi.org/10.1016/j.apsusc.2006.09.022
Autor:
Daniel A. Fischer, Brandon M. Vogel, Dean M. DeLongchamp, Marc C. Gurau, Lee J. Richter, Eric K. Lin, Sharadha Sambasivan
Publikováno v:
Langmuir. 23:834-842
We measured the molecular order of poly(3-alkylthiophene) chains in thin films before and after melting through the combination of several polarized photon spectroscopies: infrared (IR) absorption, variable angle spectroscopic ellipsometry (SE), and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2577aa1775acfe7a95199e4a22a32186
https://doi.org/10.1021/la0618972
https://doi.org/10.1021/la0618972
Publikováno v:
Applied Surface Science. 253:1010-1014
Near-edge X-ray absorption fine structure (NEXAFS) spectroscopy was used to quantify the surface composition and depth profiling of photoacid generators in thin film photoresist materials by varying the entrance-grid bias of a partial electron yield
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4fd26648730689b60bc75047a7433617
https://doi.org/10.1016/j.apsusc.2006.03.089
https://doi.org/10.1016/j.apsusc.2006.03.089
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 24:1484-1488
Self-assembled monolayers have increasingly been explored as potential protective films in devices against friction and adhesion. However, detailed characterization of the monolayer film structure is difficult. This article utilizes a combination of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c2dcbda04e9641bf6bdb390ee88588f7
https://doi.org/10.1116/1.2204920
https://doi.org/10.1116/1.2204920
Autor:
Sarbajit Banerjee, James A. Misewich, Sharadha Sambasivan, Douglas H. Lowndes, Stanislaus S. Wong, Mahalingam Balasubramanian, Wei-Qiang Han, Gyula Eres, Alexander A. Puretzky, David B. Geohegan, Daniel A. Fischer, Tirandai Hemraj-Benny
Publikováno v:
Small. 2:26-35
We have demonstrated near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a particularly useful and effective technique for simultaneously probing the surface chemistry, surface molecular orientation, degree of order, and electronic str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::60a013f53740439e57aab01f97c6bc71
https://doi.org/10.1002/smll.200500256
https://doi.org/10.1002/smll.200500256
Autor:
Dean M. DeLongchamp, Jean M. J. Frechet, Sharadha Sambasivan, Amanda R. Murphy, Daniel A. Fischer, Priscilla Vandyke, Vivek Subramanian, Jinsong Liu, Eric K. Lin, Paul Chang
Publikováno v:
Chemistry of Materials. 17:6033-6041
Symmetrical α,ω-substituted quarter-(T4), penta-(T5), sexi-(T6), and heptathiophene (T7) oligomers containing thermally removable aliphatic ester solubilizing groups were synthesized, and their UV−vis and thermal characteristics were compared. Sp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15d33719b0d121ad4fd813889b98cb0d
https://doi.org/10.1021/cm0515350
https://doi.org/10.1021/cm0515350
Autor:
Vivek Subramanian, Daniel A. Fischer, Eric K. Lin, Amanda R. Murphy, Dean M. DeLongchamp, Jean M. J. Fréchet, Sharadha Sambasivan, Paul Chang
Publikováno v:
Advanced Materials. 17:2340-2344
The use of near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a non-destructive technique to quantify the simultaneous chemical conversion, molecular ordering, and defect formation of soluble oligothiophene precursor films intended fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d28c0265b7b6fb424e9fa4b9222efcf9
https://doi.org/10.1002/adma.200500263
https://doi.org/10.1002/adma.200500263
Autor:
Ronald L. Jones, Daniel A. Fischer, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Eric K. Lin, Wen-Li Wu, M Angelopoulos, Christopher L. Soles, Sharadha Sambasivan, D M. Goldfarb
Publikováno v:
Langmuir. 21:4007-4015
Near-edge X-ray absorption fine structure spectroscopy (NEXAFS) is utilized to provide insight into surface chemical effects in model photoresist films. First, NEXAFS was used to examine the resist/air interface including surface segregation of a pho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::515c4ec2a76f72d76fb521da09cdc4ec
https://doi.org/10.1021/la047160z
https://doi.org/10.1021/la047160z