Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Shang-Jen Tsai"'
Autor:
Shang-Jen Tsai, 蔡尚任
95
This research mainly studied material characteristics and the applications of infrared sensors. The experiment was divided into two parts, one was bolometer and the other was thermoelectric. In bolometer experiment, I choose to use RuO2 and A
This research mainly studied material characteristics and the applications of infrared sensors. The experiment was divided into two parts, one was bolometer and the other was thermoelectric. In bolometer experiment, I choose to use RuO2 and A
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/29062093507974038581
Autor:
Shang-jen Tsai, 蔡尚仁
90
The purpose of this study was to investigate(a)the status quo of the Tainan municipal primary school teachers’ attitude towards CAI in mathematics,(b)the differences of the attitude towards CAI in mathematics on the variables of tea
The purpose of this study was to investigate(a)the status quo of the Tainan municipal primary school teachers’ attitude towards CAI in mathematics,(b)the differences of the attitude towards CAI in mathematics on the variables of tea
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/84268322671988272853
Autor:
Rizal Tanjung, Jinn-Shyan Wang, Shang-Jen Tsai, Tay-Jyi Lin, Yung-Chen Chien, Po-Hao Wang, Shu-Wei Syu, Yi-Sian Lin, Tien-Fu Chen, Xuan-Yu Lin
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25:3341-3354
An asymmetric architecture is commonly used in modern embedded systems to reduce energy consumption. The systems tend to execute more applications in the energy-efficient core, which typically employs ultralow voltage (ULV) to save energy. However, c
Publikováno v:
Integration. 54:24-36
Voltage scaling is an effective technique to reduce power consumption in processor systems. Unfortunately, timing discrepancies between L1 caches and cores occur with the scaling down of voltage. These discrepancies are primarily caused by the severe
Publikováno v:
VLSI-DAT
The ever-increasing transistor threshold-voltage (Vth) variation caused by process technologies shrink brings the performance and reliability issues in SRAM cells. To keep power limitations, scaling down the supply voltage is inevitable in mobile dev