Zobrazeno 1 - 10
of 104
pro vyhledávání: '"Shamiryan, D."'
Autor:
Redolfi, A., Kubicek, S., Rooyackers, R., Kim, M.-S., Sleeckx, E., Devriendt, K., Shamiryan, D., Vandeweyer, T., Delande, T., Horiguchi, N., Togo, M., Wouters, J.M.D., Jurczak, M., Hoffmann, T., Cockburn, A., Gravey, V., Diehl, D.L.
Publikováno v:
In Solid State Electronics May 2012 71:106-112
Autor:
Kunnen, E., Barkema, G.T., Maes, C., Shamiryan, D., Urbanowicz, A., Struyf, H., Baklanov, M.R.
Publikováno v:
In Microelectronic Engineering 2011 88(5):631-634
Publikováno v:
In Microelectronic Engineering 2010 87(9):1669-1673
Publikováno v:
In Microelectronic Engineering 2010 87(3):462-465
Publikováno v:
In Microelectronic Engineering 2009 86(1):96-98
Publikováno v:
In Microelectronic Engineering 2008 85(10):2164-2168
Publikováno v:
In Colloids and Surfaces A: Physicochemical and Engineering Aspects 2007 300(1):111-116
Autor:
Degroote, B., Rooyackers, R., Vandeweyer, T., Collaert, N., Boullart, W., Kunnen, E., Shamiryan, D., Wouters, J., Van Puymbroeck, J., Dixit, A., Jurczak, M.
Publikováno v:
In Microelectronic Engineering 2007 84(4):609-618
Autor:
Beckx, S., Demand, M., Locorotondo, S., Henson, K., Claes, M., Paraschiv, V., Shamiryan, D., Jaenen, P., Boullart, W., Degendt, S., Biesemans, S., Vanhaelemeersch, S., Vertommen, J., Coenegrachts, B.
Publikováno v:
In Microelectronics Reliability 2005 45(5):1007-1011
Publikováno v:
In Materials Today January 2004 7(1):34-39