Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Shamik Kundu"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42:1406-1410
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36d263610a967fad4dc6c09955b25308
https://doi.org/10.1109/tcad.2022.3199153
https://doi.org/10.1109/tcad.2022.3199153
Autor:
Ayush Arunachalam, Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Suriyaprakash Natarajan, Kanad Basu
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42:1085-1098
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7107e7327485226d64bf5a41fcbac7d2
https://doi.org/10.1109/tcad.2022.3198036
https://doi.org/10.1109/tcad.2022.3198036
Publikováno v:
IEEE Design & Test. 40:90-99
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::203dbe888e6a6b3dbfa6c63e72e37d11
https://doi.org/10.1109/mdat.2022.3183545
https://doi.org/10.1109/mdat.2022.3183545
Publikováno v:
IEEE Transactions on Computers. :1-15
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::158fad1a9869e90d413e89b594726ed3
https://doi.org/10.1109/tc.2023.3241218
https://doi.org/10.1109/tc.2023.3241218
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:4952-4964
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b3a042c37cd20b0de04ccd7288bcf14
https://doi.org/10.1109/tcad.2022.3149745
https://doi.org/10.1109/tcad.2022.3149745
Autor:
Shakya Chakrabarti, Akshay Wali, Harikrishnan Ravichandran, Shamik Kundu, Thomas F. Schranghamer, Kanad Basu, Saptarshi Das
Publikováno v:
ACS Applied Nano Materials. 5:14447-14455
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb8955872868d59230a893db8145c0b8
https://doi.org/10.1021/acsanm.2c02807
https://doi.org/10.1021/acsanm.2c02807
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:466-477
This paper presents RTL-ConTest, a Register Transfer Level (RTL) security vulnerability detection algorithm, that extracts critical process flows from a RTL design and executes RTL-level concolic testing to generate security test cases for identifyin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f1668fcc2a57fb5a8464298ee3553767
https://doi.org/10.1109/tcad.2021.3066560
https://doi.org/10.1109/tcad.2021.3066560
Autor:
Shamik Kundu, Kanad Basu
Publikováno v:
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc8ca1f04208f4551d133aae5ea81372
https://doi.org/10.1109/iolts56730.2022.9897702
https://doi.org/10.1109/iolts56730.2022.9897702
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02ab8de4054aea5e4a7207bddb47f70e
https://doi.org/10.1109/itc50671.2022.00061
https://doi.org/10.1109/itc50671.2022.00061
Autor:
Ayush Arunachalam, Athulya Kizhakkayil, Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Robert Jin, Fei Su, Kanad Basu
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5573fa770e2de473ff301cd5335e2d9a
https://doi.org/10.1109/itc50671.2022.00031
https://doi.org/10.1109/itc50671.2022.00031