Zobrazeno 1 - 10
of 45
pro vyhledávání: '"Seutter, S.M."'
Publikováno v:
In Surface Science 1999 438(1):131-141
Autor:
Sandhya, C., Ganguly, U., Singh, K.K., Singh, P.K., Olsen, C., Seutter, S.M., Hung, R., Conti, G., Ahmed, K., Krishna, N., Vasi, J., Mahapatra, S.
Publikováno v:
2008 IEEE International Reliability Physics Symposium; 2008, p406-411, 6p
Autor:
Sandhya, C., Ganguly, U., Singh, K.K., Olsen, C., Seutter, S.M., Conti, G., Ahmed, K., Krishna, N., Vasi, J., Mahapatra, S.
Publikováno v:
2008 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2008, p1-7, 7p
Autor:
Ke, Jack Chun-Ren1,2 (AUTHOR) kejack1986@gmail.com, Thomas, Andrew Guy1,2,3 (AUTHOR) andrew.g.thomas@manchester.ac.uk, Peake, Joseph4 (AUTHOR) joseph.peake@croda.com, Sayer, Robert4 (AUTHOR) robert.sayer@gmail.com
Publikováno v:
Surfaces (2571-9637). Mar2024, Vol. 7 Issue 1, p26-43. 18p.
Publikováno v:
In Surface Science 20 January 2000 445(2-3):L71-L75
Publikováno v:
In Surface Science 2000 464(1):L708-L714
Publikováno v:
Surface Science; January 2000, Vol. 445 Issue: 2-3 pL71-L75, 5p
Autor:
Kempisty, Pawel1,2 (AUTHOR) pkempisty@unipress.waw.pl, Kawka, Karol1 (AUTHOR), Kusaba, Akira2 (AUTHOR), Kangawa, Yoshihiro2 (AUTHOR)
Publikováno v:
Materials (1996-1944). Sep2023, Vol. 16 Issue 17, p5982. 16p.
Autor:
Ishaug, B.E., Seutter, S.M., Dabiran, A.M., Cohen, P.I., Farrow, R.F.C., Weller, D., Parkin, S.S.P.
Publikováno v:
Surface Science; May 1997, Vol. 380 Issue: 1 p75-82, 8p
Autor:
Wu, Peng, Liu, Jianping, Li, Fangzhi, Ren, Xiaoyu, Tian, Aiqin, Zhou, Wei, Zhang, Fan, Li, Xuan, Zhou, Bolin, Ikeda, Masao, Yang, Hui
Publikováno v:
Nanomaterials (2079-4991); May2024, Vol. 14 Issue 9, p748, 9p