Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Seungil Jeung"'
Publikováno v:
THE TRANSACTION OF THE KOREAN INSTITUTE OF ELECTRICAL ENGINEERS P. :99-103
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91710e07a237d500600136301ca87fed
https://doi.org/10.5370/kieep.2020.69.2.99
https://doi.org/10.5370/kieep.2020.69.2.99
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 38:2086-2098
S-parameters are widely utilized for characterizing circuit components and systems. Although they only contain the frequency domain responses with a limited range, the time domain characteristics of the circuit systems can be estimated using processi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c5786ba0d3c62cf978c4b245d0d6fbb
https://doi.org/10.1109/tcad.2018.2878192
https://doi.org/10.1109/tcad.2018.2878192
Autor:
Byung-Sung Kim, Jaeyong Cho, Kibeom Kim, Hwiseob Lee, Jonghyuck Jeong, Seungyoung Ahn, Jun-Seong Kim, Seungil Jeung, Karam Hwang
Publikováno v:
IEEE Microwave and Wireless Components Letters. 27:936-938
The time-domain gating method (TGM) is an accurate and useful method to characterize the test fixtures used in the measurement of high-speed connectors. However, its accuracy can be degraded by the gating error when the test fixture contains the impe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a80573212615b0256bf35a560a92eb58
https://doi.org/10.1109/lmwc.2017.2746686
https://doi.org/10.1109/lmwc.2017.2746686
Publikováno v:
The Transactions of The Korean Institute of Electrical Engineers. 63:1716-1721
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70f707a321a4c2acd587222a9b9d4661
https://doi.org/10.5370/kiee.2014.63.12.1716
https://doi.org/10.5370/kiee.2014.63.12.1716