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pro vyhledávání: '"Seungbin Jeong"'
Publikováno v:
IEEE Electron Device Letters. 44:841-844
Publikováno v:
IEEE Electron Device Letters. 43:1527-1530
Autor:
Tony F. Wu, Andrew Bartolo, Mary Wootters, Pulkit Tandon, Elisa Vianello, Mohamed M. Sabry Aly, Subhasish Mitra, Binh Quang Le, Robert M. Radway, H.-S. Philip Wong, Edith Beigne, Etienne Nowak, Pascal Vivet, Haitong Li, William Hwang, Seungbin Jeong
Publikováno v:
ISSCC
Non-volatility is emerging as an essential on-chip memory characteristic across a wide range of application domains, from edge nodes for the Internet of Things (IoT) to large computing clusters. On-chip non-volatile memory (NVM) is critical for low-e