Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Seung Oun Kang"'
Autor:
Ju Sung Kim, Do Young Kim, Booki Min, Hyun Oh Joo, Sung Duk Kwon, Seung Ju Lim, Seung Oun Kang, Sang Jung Ahn, Eun Ha Choi
Publikováno v:
Nanoscience and Nanotechnology Letters. 7:945-949
Autor:
Eun Ha Choi, Seung Oun Kang, Hyun Joo Oh, Changjo Kim, Han S. Uhm, Yoon S. Choi, Byeong Seong Cho
Publikováno v:
Current Applied Physics. 11:S172-S176
The liquid metal ion sources (LMIS) in focused ion beam (FIB) system have many advantages of high current density, high brightness and low ion energy spread. There are two electrodes being emitter and extractor for field ion emission in LMIS. But sev
Autor:
Byoungchoo Park, Hideo Takezoe, Mina Kim, Yoonho Seo, Yunki Kim, Wongun Jang, Eun Ha Choi, Sun Woong Kim, Guang Sup Cho, Seung Oun Kang
Publikováno v:
Advanced Materials. 21:771-775
Publikováno v:
Transactions of the Korean Society of Mechanical Engineers A. 30:1166-1172
This paper describes an alignment method of the ion column which is used for a focused-ion-beam machining system. The alignment parameters for mechanical and electrical components are introduced, and also sample images are used for evaluating the exp
Publikováno v:
Materials Science and Engineering: B. 100:275-279
The change in work function was studied on Indium–tin-oxide (ITO) surface after O-plasma treatment using γ-focused ion beam (γ-FIB). As the surface of ITO experienced more O-plasma treatment, both the surface resistivity and the work function got
Autor:
Jaewon Cho, Jae Yong Lim, Eun Ha Choi, Han Sup Uhm, Guangsup Cho, Jun Soek Oh, Seung Oun Kang, Byung Doc Ko
Publikováno v:
Journal of Applied Physics. 94:764-769
The work functions φω of MgO single crystals with its respective orientation (111), (200), and (220) have been investigated from their ion-induced secondary electron emission coefficient γ, respectively, using various ions with different ionizatio
Publikováno v:
Japanese Journal of Applied Physics. 41:L1006-L1009
We have suggested that the work function φω of various kinds of dielectric material can be experimentally obtained from the direct measurement of ion-induced secondary electron emission coefficient γ for various kinds of slow ion with different io
Publikováno v:
Journal of Physics and Chemistry of Solids. 63:875-879
The microsturctural properties in lattice-mismatched InAs 0.3 P 0.7 /InP modulation-doped single quantum wells were investigated by using transmission electron microscopy (TEM) and the Raman scattering spectroscopy measurements, and the low-temperatu
Autor:
Keon-Ho Yoo, Seung-Oun Kang, H. J. Oh, D. U. Lee, D. C. Choo, T. W. Kim, J. W. Hyun, Young Soo Yoon
Publikováno v:
Journal of Applied Physics. 91:4238-4241
Ion beam-assisted deposition of Ni on p-InP (100) at room temperature was performed in order to produce Ni thin films with high quality and Ni/p-InP (100) heterostructures with abrupt heterointerfaces. An atomic force microscopy image showed that the
Publikováno v:
Solid State Communications. 115:77-80
Al two-terminal diodes were fabricated utilizing a focused ion-beam technique. Current–voltage ( I – V ) and conductance–voltage ( σ – V ) measurements at room temperature showed a Coulomb staircase and conductance oscillations, respectively