Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Seulki Kang"'
Autor:
Xiaole Hu, Ji-eun Park, Seulki Kang, Chan-Jin Kim, Youngji Kim, Jerome Kartham Hyun, So-Jung Park
Publikováno v:
Nanoscale. 14:12849-12855
Here, we report a simple and general approach to fabricate free-standing two-dimensional (2D) sheets of nanoparticles by the simultaneous self-assembly of hydrophobic nanoparticles and hydrophilic polymers at the liquid-liquid interface. The nanopart
Publikováno v:
Accounts of chemical research. 55(16)
ConspectusConjugated polymers have been actively studied as an alternative to inorganic semiconductors for their unique optical and electrical properties and low-cost solution processability. However, typical conjugated polymer films contain numerous
Publikováno v:
ACS Applied Materials & Interfaces. 13:4442-4449
Responsive cooling materials that mimic sweat glands have gained popularity because they are efficient and do not require artificial energy sources. Temperature-responsive hydrogels sweat above their volume transition temperature through the release
Autor:
Peter Ercius, Jungwon Park, Seulki Kang, Dohun Kang, Sangdeok Shim, Hans Elmlund, Cyril F. Reboul, S. K. Kang, Sungin Kim, Byung Hyo Kim, Chiara Machello, Taeghwan Hyeon, Junyoung Heo, So Jung Park, Jimin Kwag
Publikováno v:
Nano Letters. 21:1175-1183
Active sites and catalytic activity of heterogeneous catalysts is determined by their surface atomic structures. However, probing the surface structure at an atomic resolution is difficult, especially for solution ensembles of catalytic nanocrystals,
Publikováno v:
ACS Nano. 14:12203-12209
Herein, we report the cooperative self-assembly of nanoparticles and block copolymers at the air-water interface, which can generate highly uniform and readily transferable composite films with tunable nanoscale architecture and functionalities. Inte
Autor:
Dohun Kang, Byung Hyo Kim, Sangdeok Shim, So Jung Park, Seulki Kang, Joodeok Kim, Taeghwan Hyeon, Won Bo Lee, Jungwon Park, Jaeyoung Sung, Ji Woong Yu, Ji-Hyun Kim, Minyoung Lee, Hayeon Baek, Yuna Bae, S. K. Kang
Publikováno v:
Science Advances
Description
Thermal motion and interactions of sub–4-nm particles are directly observed by graphene liquid cell electron microscopy.
Thermal motion of colloidal nanoparticles and their cohesive interactions are of fundamental importance i
Thermal motion and interactions of sub–4-nm particles are directly observed by graphene liquid cell electron microscopy.
Thermal motion of colloidal nanoparticles and their cohesive interactions are of fundamental importance i
Autor:
Saejin Oh, Jean Bouffard, Seulki Kang, So Jung Park, Sung-Hee Chung, Myungjae Yang, Seunghun Hong
Publikováno v:
ACS Applied Materials & Interfaces. 11:28538-28545
Controlling the nanoscale morphology of conducting polymer/nanoparticle hybrid films is a highly desired but challenging task. Here, we report that such functional hybrid films with unprecedented structural order can be formed through the self-assemb
Autor:
Sangwoo Park, Jinwoo Oh, Jonghwi Lee, Seulki Kang, Byoung Soo Kim, Tae-Hyung Kang, Jeong Gon Son, In-Suk Choi
Publikováno v:
Composites Part B: Engineering. 162:580-588
The recent rapid development of soft electronics and wearable technology has demanded materials with the function of combining mechanical deformation and electronics. Particularly, materials simultaneously having memory shape characteristics in which
Autor:
Taihei Mori, Shinichi Nakazawa, Yuichiro Yamazaki, Seulki Kang, Yosuke Okamoto, Kotaro Maruyama, Akinori Kawamura
Publikováno v:
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV.
The precise metrology for edge placement error (EPE) is required especially in EUV era. Last year, we proposed new contour extraction algorithm using machine learning and verified the robustness to SEM noise on AEI pattern. In this study, we suggest
Autor:
Danilo De Simone, Sandip Halder, Paulina Rincon-Delgadillo, Yuichiro Yamazaki, Andreas Frommhold, Gian Lorusso, Philippe Leray, Sayantan Das, Seulki Kang, Kotaro Maruyama
Publikováno v:
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV.
In the extreme ultraviolet (EUV) lithography process, stochastic defects are randomly generated and can have a significant impact on the yield of high-volume manufacturing (HVM) when printed even at an extremely low probability down to parts per tril