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pro vyhledávání: '"Sergiu Stejar"'
Publikováno v:
Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing.
A scanning laser computer assisted microscope in which the sample is scanned electromagnetic is used to produce images from semiconductor devices using photo induced current. We obtained 2D and 3D images which were analyzed in connection with current
Publikováno v:
SPIE Proceedings.
Scanning optical microscopy computer assisted has the advantages that a wide range of imaging modes is possible. We have constructed a new computer assisted laser scanning which offers the possibility to obtain 2D and 3D images. The paper presents th
Conference
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