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pro vyhledávání: '"Sergey O. Safonov"'
Autor:
Sergey O. Safonov, Veniamin G. Stakhin, Igor A. Kharitonov, Konstantin O. Petrosyants, Sergey V. Lebedev, Lev M. Sambursky
Publikováno v:
Microelectronics Reliability. 79:416-425
I-V characteristics and reliability parameters for the set of hardened SOI MOSFET's with special layouts and tungsten metallization to provide additional thermal tolerance for high-temperature SOI CMOS IC's are investigated in the temperature range u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a01b65768a662fd12b3a395b7f14c625
https://doi.org/10.1016/j.microrel.2017.05.018
https://doi.org/10.1016/j.microrel.2017.05.018
