Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Sergey Levichev"'
Autor:
Konstantin Iansitov, Semyon Dorokhin, Sergey Levichev, Liubov Antiufrieva, Alexander Dvorkovich
Publikováno v:
2021 International Conference Engineering and Telecommunication (En&T).
Autor:
Adil Chahboun, Sigrid Bernstorff, Joaquim Agostinho Moreira, Dr. KOPPOLE CHANDRA SEKHAR, Maria de Jesus de Matos Gomes, Maja Micetic, Abilio Almeida, Sergey Levichev, Koppole Kamakshi, Mário António Caixeiro de Castro Pereira
Publikováno v:
Repositório Científico de Acesso Aberto de Portugal
Repositório Científico de Acesso Aberto de Portugal (RCAAP)
instacron:RCAAP
Repositório Científico de Acesso Aberto de Portugal (RCAAP)
instacron:RCAAP
Zinc oxide (ZnO) nanocrystals (NCs) embedded in alumina (Al2O3) matrix were produced via rapid thermal annealing (RTA) of pulsed laser deposited ZnO/Al2O3 multilayered nanostructures. The effect of the thickness ratio (R) between Al2O3 and ZnO in one
Publikováno v:
Modern Physics Letters B. 24:2837-2843
CdTe -doped SiO 2 thin films were produced by RF magnetron co-sputtering technique. Presence of CdTe nanocrystals inside the silica matrix was confirmed by Raman spectroscopy and grazing incidence X-ray diffraction. The samples demonstrate size depen
Autor:
Anabela Rolo, Eduardo Alves, Adil Chahboun, Sigrid Bernstorff, Maria de Jesus de Matos Gomes, Sergey Levichev, Nuno Pessoa Barradas, Anatoli Khodorov
Publikováno v:
physica status solidi c. 7:2724-2726
Mn-doped ZnO/TiO2 multilayer nanostructures were grown on Si(100) substrates by the pulsed laser deposition technique. Post growing annealing in oxygen or nitrogen atmosphere was performed to improve the crystallinity of the nanostructures. The cryst
Autor:
Anabela Rolo, Eduardo Alves, E M F Vieira, Adil Chahboun, Ivana Capan, Andrea Parisini, Sigrid Bernstorff, Maria de Jesus de Matos Gomes, Maja Micetic, Javier Martín Sánchez, Sergey Levichev, Nuno Pessoa Barradas, Olinda Conde
Publikováno v:
Repositório Científico de Acesso Aberto de Portugal
Repositório Científico de Acesso Aberto de Portugal (RCAAP)
instacron:RCAAP
Journal of applied physics 111 (2012): 104323. doi:10.1063/1.4722278
info:cnr-pdr/source/autori:E. M. F. Vieira, J. Martín-Sánchez, A. G. Rolo, A. Parisini, M. Buljan, I. Capan, E. Alves, N. P. Barradas, O. Conde, S. Bernstorff, A. Chahboun, S. Levichev, M. J. M. Gomes/titolo:Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe%2FSiO2 superlattice/doi:10.1063%2F1.4722278/rivista:Journal of applied physics/anno:2012/pagina_da:104323/pagina_a:/intervallo_pagine:104323/volume:111
Repositório Científico de Acesso Aberto de Portugal (RCAAP)
instacron:RCAAP
Journal of applied physics 111 (2012): 104323. doi:10.1063/1.4722278
info:cnr-pdr/source/autori:E. M. F. Vieira, J. Martín-Sánchez, A. G. Rolo, A. Parisini, M. Buljan, I. Capan, E. Alves, N. P. Barradas, O. Conde, S. Bernstorff, A. Chahboun, S. Levichev, M. J. M. Gomes/titolo:Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe%2FSiO2 superlattice/doi:10.1063%2F1.4722278/rivista:Journal of applied physics/anno:2012/pagina_da:104323/pagina_a:/intervallo_pagine:104323/volume:111
The authors would like also to thank José Santos for technical support.
In this work, SiGe/SiO2 multi-layer (ML) films with layer thickness in the range of a few nanometers were successfully fabricated by conventional RF-magnetron sputtering at
In this work, SiGe/SiO2 multi-layer (ML) films with layer thickness in the range of a few nanometers were successfully fabricated by conventional RF-magnetron sputtering at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aa3510ef60e7d6fcb158222244d5d40d
Publikováno v:
Repositório Científico de Acesso Aberto de Portugal
Repositório Científico de Acesso Aberto de Portugal (RCAAP)
instacron:RCAAP
Repositório Científico de Acesso Aberto de Portugal (RCAAP)
instacron:RCAAP
In this work, CdSe nanocrystals (NCs) embedded in SiO(2) matrix were grown by radio frequency (RF)sputtering technique. X-ray technique was used to characterise the structural properties of the system. The NC's size was estimated to be around 4 +/- 1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::93f453d2e94f750d2069556ad5d412be
Publikováno v:
Repositório Científico de Acesso Aberto de Portugal
Repositório Científico de Acesso Aberto de Portugal (RCAAP)
instacron:RCAAP
Repositório Científico de Acesso Aberto de Portugal (RCAAP)
instacron:RCAAP
In this work post-growth annealing effect on CdSe/SiO2 thin films grown by rf-magnetron co-sputtering technique was investigated. Annealed samples were characterised by Raman scattering, grazing incidence X-ray diffraction and room temperature photol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cb52d6efa9615f8205521f72b28b922a