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Autor:
Sergej Mutas
Publikováno v:
EDFA Technical Articles. 15:4-11
This article discusses the basic procedures involved in atom probe tomography (APT) and demonstrates its use on complex material stacks. Although still a relatively new technique, APT has moved to the forefront of semiconductor failure analysis becau
Autor:
Torben Kelwing, Andreas Naumann, Martin Trentzsch, Sergej Mutas, Bernhard Trui, Lutz Herrmann, Falk Graetsch, Christoph Klein, Lutz Wilde, Susanne Ohsiek, Martin Weisheit, Anita Peeva, Inka Richter, Hartmut Prinz, Alexander Wuerfel, Rick Carter, Rolf Stephan, Peter Kücher, Walter Hansch
Publikováno v:
ECS Meeting Abstracts. :1484-1484
not Available.